• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

A Novel Low-Cost Approach to MCM Interconnect Test.

Bruce C. KimAbhijit ChatterjeeMadhavan SwaminathanDavid E. Schimmel
Published in: ITC (1995)
Keyphrases
  • low cost
  • real time
  • high speed
  • data sets
  • genetic algorithm
  • computer vision
  • probabilistic model
  • test data
  • statistical significance
  • rfid tags