Pramodchandran N. Variyam

Publication Activity (10 Years)

Years Active: 1997-2010
Publications (10 Years): 0

Publications

Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices. J. Electron. Test. 26 (4) (2010)
Venkat Kalyanaraman, Bruce C. Kim, Pramodchandran N. Variyam, Sasikumar Cherubal
DIBPro: Automatic Diagnostic Program Generation Tool. ITC (2006)
Ganesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee
Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers. ETS (2005)
John M. Hitchcock, Aduri Pavan, Pramodchandran N. Variyam
Partial Bi-Immunity and NP-Completeness Electron. Colloquium Comput. Complex. (025) (2004)
Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam
Automatic Diagnostic Program Generation for Mixed Signal Load Board. ITC (2003)
Pramodchandran N. Variyam, Sasikumar Cherubal, Abhijit Chatterjee
Prediction of analog performance parameters using fast transienttesting. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21 (3) (2002)
Achintya Halder, Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley
Measuring Stray Capacitance on Tester Hardware. VTS (2002)
Pramodchandran N. Variyam
Increasing the IDDQ test resolution using current prediction. ITC (2000)
Pramodchandran N. Variyam, Abhijit Chatterjee
Specification-driven test generation for analog circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19 (10) (2000)
Pramodchandran N. Variyam, Vinay Agrawal
Measuring code edges of ADCs using interpolation and its application to offset and gain error testing. ITC (2000)
Pramodchandran N. Variyam, Abhijit Chatterjee
Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling. IEEE Des. Test Comput. 17 (3) (2000)
Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee
Efficient Test Generation for Transient Testing of Analog Circuits Using Partial Numerical Simulation. VTS (1999)
Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee
Test Generation for Analog Circuits Using Partial Numerical Simulation. VLSI Design (1999)
Pramodchandran N. Variyam, Abhijit Chatterjee
Specification-Driven Test Design for Analog Circuits. DFT (1998)
Heebyung Yoon, Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi
Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits. VTS (1998)
Pramodchandran N. Variyam, Abhijit Chatterjee
Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements. VTS (1998)
Pramodchandran N. Variyam, Abhijit Chatterjee
Test generation for comprehensive testing of linear analog circuits using transient response sampling. ICCAD (1997)
Pramodchandran N. Variyam, Abhijit Chatterjee
FLYER: Fast Fault Simulation of Linear Analog Circuits Using Polynomial Waveform and Perturbed State Representation. VLSI Design (1997)
Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi
Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling. VTS (1997)