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Test generation for comprehensive testing of linear analog circuits using transient response sampling.
Pramodchandran N. Variyam
Abhijit Chatterjee
Published in:
ICCAD (1997)
Keyphrases
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test generation
analog circuits
transient response
test cases
symbolic execution
software testing
code coverage
fault diagnosis
quality assurance
static analysis
digital circuits
neural network
control strategy
control system
object oriented
artificial intelligence
software development
open source
machine learning