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Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements.
Pramodchandran N. Variyam
Abhijit Chatterjee
Published in:
VTS (1998)
Keyphrases
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analog circuits
neural network
digital circuits
data sets
data mining
pattern recognition
data model
software development
multi view
test cases
fault diagnosis
user satisfaction
conducted an empirical study