Specification-driven test generation for analog circuits.
Pramodchandran N. VariyamAbhijit ChatterjeePublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2000)
Keyphrases
- database systems
- test generation
- analog circuits
- test cases
- fault diagnosis
- digital circuits
- symbolic execution
- design automation
- test sequences
- quality assurance
- neural network
- static analysis
- software testing
- data sets
- data flow
- formal specification
- test data generation
- software engineering
- decision trees
- code coverage