Prediction of analog performance parameters using fast transienttesting.
Pramodchandran N. VariyamSasikumar CherubalAbhijit ChatterjeePublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2002)
Keyphrases
- root mean square error
- input parameters
- parameter values
- prediction accuracy
- information systems
- prediction model
- parameter space
- parameter estimation
- signal processing
- linear regression model
- sensitivity analysis
- fault diagnosis
- database
- radial basis function network
- parameter optimization
- high speed
- extreme values
- phase space reconstruction