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Efficient Test Generation for Transient Testing of Analog Circuits Using Partial Numerical Simulation.
Pramodchandran N. Variyam
Junwei Hou
Abhijit Chatterjee
Published in:
VTS (1999)
Keyphrases
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numerical simulations
test generation
test cases
analog circuits
symbolic execution
theoretical analysis
test sequences
static analysis
quality assurance
software testing
numerical calculation
neural network
computational fluid dynamics
digital circuits
fault diagnosis
high speed
artificial intelligence