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Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits.
Heebyung Yoon
Pramodchandran N. Variyam
Abhijit Chatterjee
Naveena Nagi
Published in:
VTS (1998)
Keyphrases
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signal processing
statistical inference
bayesian inference
data sets
probabilistic model
information extraction
parameter estimation
statistical model
information retrieval
artificial intelligence
data points
object oriented