Measuring Stray Capacitance on Tester Hardware.
Achintya HalderAbhijit ChatterjeePramodchandran N. VariyamJohn RidleyPublished in: VTS (2002)
Keyphrases
- low cost
- hardware and software
- high speed
- real time
- parallel hardware
- test cases
- black box
- low power
- computing power
- computer systems
- high frequency
- embedded systems
- computing systems
- information retrieval
- graphics hardware
- personal computer
- image processing
- hardware implementation
- computational power
- genetic algorithm
- computing platform
- transmission line
- data acquisition
- high end
- single chip
- standard pc