Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling.

Pramodchandran N. Variyam Abhijit Chatterjee

Published in: IEEE Des. Test Comput. (2000)

Keyphrases

analog circuits
transient response
fault diagnosis
digital circuits
neural network
control system
pid controller
control strategy
signal processing
artificial intelligence
hidden markov models
model based diagnosis
control parameters