Test Generation for Analog Circuits Using Partial Numerical Simulation.
Pramodchandran N. VariyamJunwei HouAbhijit ChatterjeePublished in: VLSI Design (1999)
Keyphrases
- numerical simulations
- test generation
- analog circuits
- test cases
- digital circuits
- fault diagnosis
- theoretical analysis
- static analysis
- quality assurance
- software testing
- lattice boltzmann
- source code
- numerical calculation
- neural network
- real time
- hidden markov models
- expert systems
- high level
- artificial intelligence
- finite element method
- temperature field
- object oriented
- genetic algorithm