A Novel RF Test Scheme Based on a DFT Method.

Jee-Youl Ryu Bruce C. Kim Iboun Taimiya Sylla

Published in: J. Electron. Test. (2006)

Keyphrases

high accuracy
test data
preprocessing
data sets
significant improvement
dynamic programming
edge detection
support vector machine svm
clustering method
detection method
synthetic data
hybrid method
statistical significance
similarity measure
multiscale
computational cost