Yervant Zorian

Publication Activity (10 Years)

Years Active: 1984-2024
Publications (10 Years): 48

Top Venues

ITC

VTS

EWDTS

IEEE Des. Test

Publications

Mehdi Baradaran Tahoori, Yervant Zorian
Special Issue on Silicon Lifecycle Management. IEEE Des. Test 41 (4) (2024)
Fabian Vargas, Vache Galstyan, Gurgen Harutyunyan, Yervant Zorian
On-Chip Sensor to Monitor Aging Evolution in FinFET-Based Memories. IOLTS (2024)
Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management. VTS (2024)
Fei Su, Xiankun Robert Jin, Nilanjan Mukherjee, Yervant Zorian
Innovation Practices Track: Silicon Lifecycle Management Challenges and Opportunities. VTS (2023)
Artur Ghukasyan, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era. VTS (2023)
Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI. ETS (2023)
Kranthi Kandula, Ramalingam Kolisetti, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor. ITC (2023)
Costas Argyrides, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
Utilizing ECC Analytics to Improve Memory Lifecycle Management. ITC (2023)
Yervant Zorian
Silicon Lifecycle Management: Trends, Challenges and Solutions : Tutorial 2. ITC-Asia (2023)
Costas Argyrides, Vilas Sridharan, Hayk Danoyan, Gurgen Harutyunyan, Yervant Zorian
A Novel Protection Technique for Embedded Memories with Optimized PPA. ITC (2022)
Minqiang Peng, Youfa Wu, Jialiang Li, Alex Yu, Grigor Tshagharyan, Costas Argyrides, Vilas Sridharan, Gurgen Harutyunyan, Yervant Zorian, Nilanjan Mukherjee
Innovative Practices Track: What's Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety. VTS (2022)
Yu Huang, David Francis, Yervant Zorian, Nilanjan Mukherjee
Automotive Test and Reliability. ITC-Asia (2021)
Gurgen Harutyunyan, Suren Martirosyan, Samvel K. Shoukourian, Yervant Zorian
Memory Physical Aware Multi-Level Fault Diagnosis Flow. IEEE Trans. Emerg. Top. Comput. 8 (3) (2020)
M. Casarsa, Gurgen Harutyunyan, Yervant Zorian
Test and Diagnosis Solution for Functional Safety. ITC (2020)
Gabriele Boschi, Donato Luongo, Duccio Lazzarotti, Hanna Shaheen, Hayk T. Grigoryan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Memory FIT Rate Mitigation Technique for Automotive SoCs. ITC (2019)
S. Bandyopadhyay, J. Mekkoth, M. Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan
Innovative Practices on In-System Test and Reliability of Memories. VTS (2019)
Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38 (3) (2019)
Kuen-Jong Lee, Shi-Yu Huang, Huawei Li, Tomoo Inoue, Yervant Zorian
International Test Conference in Asia (ITC-Asia) - Bridging ITC and Test Community in Asia. ITC (2019)
Yervant Zorian, Vladimir Hahanov, Svetlana Chumachenko, Eugenia Litvinova
17th IEEE East-West Design and Test Symposium. ITC (2019)
Yervant Zorian
Trends & Challenges in Today's Automotive SOCs. MECO (2019)
Hans-Joachim Wunderlich, Yervant Zorian
Guest Editor's Introduction. IEEE Des. Test 35 (3) (2018)
Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian
Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. ITC (2018)
Yervant Zorian
The 10th China Test Conference. IEEE Des. Test 35 (6) (2018)
Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori
Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications. ITC (2018)
Art Schaldenbrand, Yervant Zorian, Stephen Sunter, Peter Sarson
IP session on ISO26262 EDA. VTS (2018)
Hayk T. Grigoryan, Samvel K. Shoukourian, Gurgen Harutyunyan, Yervant Zorian, Costas Argyrides
Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs. ITC (2018)
Tal Kogan, Yehonatan Abotbol, Gabriele Boschi, Gurgen Harutyunyan, N. Martirosyan, Yervant Zorian
Advanced Uniformed Test Approach For Automotive SoCs. ITC (2018)
Erik Jan Marinissen, Yervant Zorian
Guest Editors' Introduction: Design & Test of a High-Volume 3-D Stacked Graphics Processor With High-Bandwidth Memory. IEEE Des. Test 34 (1) (2017)
Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
An effective functional safety solution for automotive systems-on-chip. ITC (2017)
Suren Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
An efficient testing methodology for embedded flash memories. EWDTS (2017)
Christophe Eychenne, Yervant Zorian
An effective functional safety infrastructure for system-on-chips. IOLTS (2017)
Tal Kogan, Yehonatan Abotbol, Gabriele Boschi, Gurgen Harutyunyan, I. Kroul, Hanna Shaheen, Yervant Zorian
Advanced functional safety mechanisms for embedded memories and IPs in automotive SoCs. ITC (2017)
D. Sargsyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Automated flow for test pattern creation for IPs in SoC. EWDTS (2017)
Yervant Zorian
Tutorial I: Topic: Automotive test strategies. ITC-Asia (2017)
Yervant Zorian
Keynotes: Robustness challenges in the internet of things. VLSI-SoC (2017)
Hanna Shaheen, Gabriele Boschi, Gurgen Harutyunyan, Yervant Zorian
Advanced ECC solution for automotive SoCs. IOLTS (2017)
Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Experimental study on Hamming and Hsiao codes in the context of embedded applications. EWDTS (2017)
Mohamed Abid, Yervant Zorian
Welcome to the IDT 2016. IDT (2016)
Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Securing test infrastructure of system-on-chips. EWDTS (2016)
Erik Jan Marinissen, Yervant Zorian, Mario Konijnenburg, Chih-Tsun Huang, Ping-Hsuan Hsieh, Peter Cockburn, Jeroen Delvaux, Vladimir Rozic, Bohan Yang, Dave Singelée, Ingrid Verbauwhede, Cedric Mayor, Robert Van Rijsinge, Cocoy Reyes
IoT: Source of test challenges. ETS (2016)
Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Overview study on fault modeling and test methodology development for FinFET-based memories. EWDTS (2015)
Gurgen Harutunyan, Yervant Zorian
An effective embedded test & diagnosis solution for external memories. IOLTS (2015)
Víctor H. Champac, Yervant Zorian, Letícia Maria Bolzani Pöhls, Vishwani D. Agrawal
Message from the LATS2015 Chairs. LATS (2015)
Jacob A. Abraham, Ravishankar K. Iyer, Dimitris Gizopoulos, Dan Alexandrescu, Yervant Zorian
The future of fault tolerant computing. IOLTS (2015)
Yervant Zorian
Keynote 3: "Ensuring robustness in today's IoT era". IDT (2015)
Gurgen Harutyunyan, Grigor Tshagharyan, Yervant Zorian
Impact of parameter variations on FinFET faults. VTS (2015)
L. Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
A power based memory BIST grouping methodology. EWDTS (2015)
Vrezh Sargsyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Avetik Yessayan
An efficient approach for memory repair by reducing the number of spares. EWDTS (2015)
Gurgen Harutyunyan, Grigor Tshagharyan, Valery A. Vardanian, Yervant Zorian
Fault modeling and test algorithm creation strategy for FinFET-based memories. VTS (2014)
Alodeep Sanyal, Yanjing Li, Yervant Zorian
Special session 12C: Young professionals in test - Town meeting. VTS (2014)
Yervant Zorian, Soha Hassoun
Guest Editors' Introduction: Highlights of the 50th DAC. IEEE Des. Test 31 (2) (2014)
Yervant Zorian
Design, test & repair methodology for FinFET-based memories. ITC (2014)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Extending fault periodicity table for testing faults in memories under 20nm. EWDTS (2014)
Alodeep Sanyal, Yervant Zorian
Special session 12C: Town-hall meeting "young professionals in test". VTS (2013)
T. Melkumyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters. EWDTS (2013)
W. Prates, Letícia Maria Veiras Bolzani, Gurgen Harutyunyan, A. Davtyan, Fabian Vargas, Yervant Zorian
Integrating embedded test infrastructure in SRAM cores to detect aging. IOLTS (2013)
K. Amirkhanyan, A. Davtyan, Gurgen Harutyunyan, T. Melkumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Application of defect injection flow for fault validation in memories. EWDTS (2013)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Impact of process variations on read failures in SRAMs. EWDTS (2013)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
An effective solution for building memory BIST infrastructure based on fault periodicity. VTS (2013)
Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh, Yervant Zorian, Tanay Karnik, Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Carlos Tokunaga, Arijit Raychowdhury, Muhammad M. Khellah, Jaydeep Kulkarni, Vivek De, Dimiter Avresky
Design for test and reliability in ultimate CMOS. DATE (2012)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (6) (2012)
Erik Jan Marinissen, Yervant Zorian
Guest Editorial: Special Issue on Testing of 3D Stacked Integrated Circuits. J. Electron. Test. 28 (1) (2012)
P. Glenn Gulak, Rajesh Gupta, Gianluca Setti, Yervant Zorian
Message From the Steering Committee. IEEE Des. Test Comput. 29 (1) (2012)
Yervant Zorian
Addressing Test Challenges in Advanced Technology Nodes. Asian Test Symposium (2012)
Gurgen Harutunyan, Aram Hakhumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Symmetry Measure for Memory Test and Its Application in BIST Optimization. J. Electron. Test. 27 (6) (2011)
Víctor H. Champac, Fernanda Gusmão de Lima Kastensmidt, Letícia Maria Veiras Bolzani Poehls, Fabian Vargas, Yervant Zorian
12th "IEEE Latin-American Test Workshop" Porto de Galinhas, Brazil, 27-30 March 2011. J. Low Power Electron. 7 (4) (2011)
K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
A Robust Solution for Embedded Memory Test and Repair. Asian Test Symposium (2011)
Hayk T. Grigoryan, Gurgen Harutunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Generic BIST architecture for testing of content addressable memories. IOLTS (2011)
H. Avetisyan, Gurgen Harutyunyan, Valery A. Vardanian, Yervant Zorian
An efficient March test for detection of all two-operation dynamic faults from subclass Sav. EWDTS (2010)
Yervant Zorian
Test and reliability concerns for 3D-ICs. IOLTS (2010)
Mark Redford, Joseph Sawicki, Prasad Subramaniam, Cliff Hou, Yervant Zorian, Kimon Michaels
DFM: don't care or competitive weapon? DAC (2009)
Yervant Zorian
Guest Editor's Introduction: Examples of Management Decision Criteria. IEEE Des. Test Comput. 26 (2) (2009)
Erik Jan Marinissen, Yervant Zorian
Guest Editors' Introduction: The Status of IEEE Std 1500. IEEE Des. Test Comput. 26 (1) (2009)
Erik Jan Marinissen, Yervant Zorian
Testing 3D chips containing through-silicon vias. ITC (2009)
Yervant Zorian
Panel Session - Vertical integration versus disaggregation. DATE (2009)
Erik Jan Marinissen, Yervant Zorian
Guest Editors' Introduction: The Status of IEEE Std 1500 - Part 2. IEEE Des. Test Comput. 26 (3) (2009)
Erik Jan Marinissen, Yervant Zorian
IEEE Std 1500 Enables Modular SoC Testing. IEEE Des. Test Comput. 26 (1) (2009)
Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Yervant Zorian
IEEE Standard 1500 Compliance Verification for Embedded Cores. IEEE Trans. Very Large Scale Integr. Syst. 16 (4) (2008)
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories. VTS (2008)
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
Minimal March Tests for Detection of Dynamic Faults in Random Access Memories. J. Electron. Test. 23 (1) (2007)
Yasuharu Kohiyama, C. P. Ravikumar, Yasuo Sato, Laung-Terng Wang, Yervant Zorian
Next Generation Test, Diagnostics and Yield Challenges for EDA, ATE, IP and Fab - A Perspective from All Sides. ATS (2007)
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
A March-based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories. DDECS (2007)
Srikanth Venkataraman, Ruchir Puri, Steve Griffith, Ankush Oberai, Robert Madge, Greg Yeric, Walter Ng, Yervant Zorian
Making Manufacturing Work For You. DAC (2007)
Ron Wilson, Yervant Zorian
Decision-making for complex SoCs in consumer electronic products. DAC (2006)
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
Minimal March-Based Fault Location Algorithm with Partial Diagnosis for all Static Faults in Random Access Memories. DDECS (2006)
Bruce C. Kim, Yervant Zorian
Guest Editors' Introduction: Big Innovations in Small Packages. IEEE Des. Test Comput. 23 (3) (2006)
Yervant Zorian, Bruce C. Kim
Session Abstract. VTS (2006)
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
Minimal March Tests for Dynamic Faults in Random Access Memories. ETS (2006)
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories. VTS (2006)
Yervant Zorian, Dennis Wassung
Session Abstract. VTS (2006)
Nic Mokhoff, Yervant Zorian
Tradeoffs and choices for emerging SoCs in high-end applications. DAC (2006)
Baosheng Wang, Yuejian Wu, Josh Yang, André Ivanov, Yervant Zorian
SRAM Retention Testing: Zero Incremental Time Integration with March Algorithms. VTS (2005)
Yervant Zorian, Avetik Yessayan
IEEE 1500 utilization in SOC design and test. ITC (2005)
Dennis Wassung, Yervant Zorian, Magdy S. Abadir, Mark Bapst, Colin Harris
Choosing flows and methodologies for SoC design. DAC (2005)
Yervant Zorian
Today's SOC test challenges. ITC (2005)
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
Minimal March Tests for Unlinked Static Faults in Random Access Memories. VTS (2005)
Erik Jan Marinissen, Betty Prince, Doris Keitel-Schulz, Yervant Zorian
Challenges in Embedded Memory Design and Test. DATE (2005)
Nic Mokhoff, Yervant Zorian, Kamalesh N. Ruparel, Hao Nham, Francesco Pessolano, Kee Sup Kim
How to determine the necessity for emerging solutions. DAC (2005)
Yervant Zorian
Nanoscale Design & Test Challenges. Computer 38 (2) (2005)
Régis Leveugle, Yervant Zorian, Luca Breveglieri, André K. Nieuwland, Klaus Rothbart, Jean-Pierre Seifert
On-Line Testing for Secure Implementations: Design and Validation. IOLTS (2005)

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Publication Activity (10 Years)

Top Topics

Top Venues

Yervant Zorian