An efficient testing methodology for embedded flash memories.

Suren Martirosyan Gurgen Harutyunyan Samvel K. Shoukourian Yervant Zorian

Published in: EWDTS (2017)

Keyphrases

neural network
embedded systems
genetic algorithm
data sets
data mining
machine learning
information systems
feature selection
metadata
face recognition
digital libraries
multiresolution
computationally efficient
test cases
associative memory
model based testing