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An efficient testing methodology for embedded flash memories.
Suren Martirosyan
Gurgen Harutyunyan
Samvel K. Shoukourian
Yervant Zorian
Published in:
EWDTS (2017)
Keyphrases
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neural network
embedded systems
genetic algorithm
data sets
data mining
machine learning
information systems
feature selection
metadata
face recognition
digital libraries
multiresolution
computationally efficient
test cases
associative memory
model based testing