Samvel K. Shoukourian

Publication Activity (10 Years)

Years Active: 1995-2023
Publications (10 Years): 13

Top Topics

Automotive Industry

Fault Diagnosis

Finite Automata

Top Venues

Publications

Samvel K. Shoukourian, Tigran Grigoryan, Sevak Amirkhanyan
Analytics for AI Related Applications of Multidimensional Multitape Finite Automata. CECNet (2023)
Alexander Godlevsky, Hayk A. Grigoryan, Tigran Grigoryan, Samvel K. Shoukourian
Some Results on Regular Events for Multitape Finite Automata: A Preliminary Report. Bull. EATCS 133 (2021)
Gurgen Harutyunyan, Suren Martirosyan, Samvel K. Shoukourian, Yervant Zorian
Memory Physical Aware Multi-Level Fault Diagnosis Flow. IEEE Trans. Emerg. Top. Comput. 8 (3) (2020)
Hayk A. Grigoryan, Samvel K. Shoukourian
Polynomial algorithm for equivalence problem of deterministic multitape finite automata. Theor. Comput. Sci. 833 (2020)
Gabriele Boschi, Donato Luongo, Duccio Lazzarotti, Hanna Shaheen, Hayk T. Grigoryan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Memory FIT Rate Mitigation Technique for Automotive SoCs. ITC (2019)
Samvel K. Shoukourian, Yuri Shoukourian, Vladimir Sahakyan
Armenia: Communicating to World Community in Electronic Test and Design. ITC (2019)
S. Bandyopadhyay, J. Mekkoth, M. Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan
Innovative Practices on In-System Test and Reliability of Memories. VTS (2019)
Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38 (3) (2019)
Hayk T. Grigoryan, Samvel K. Shoukourian, Gurgen Harutyunyan, Yervant Zorian, Costas Argyrides
Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs. ITC (2018)
Suren Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
An efficient testing methodology for embedded flash memories. EWDTS (2017)
D. Sargsyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Automated flow for test pattern creation for IPs in SoC. EWDTS (2017)
Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Experimental study on Hamming and Hsiao codes in the context of embedded applications. EWDTS (2017)
Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Securing test infrastructure of system-on-chips. EWDTS (2016)
Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Overview study on fault modeling and test methodology development for FinFET-based memories. EWDTS (2015)
L. Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
A power based memory BIST grouping methodology. EWDTS (2015)
Vrezh Sargsyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Avetik Yessayan
An efficient approach for memory repair by reducing the number of spares. EWDTS (2015)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Extending fault periodicity table for testing faults in memories under 20nm. EWDTS (2014)
T. Melkumyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters. EWDTS (2013)
K. Amirkhanyan, A. Davtyan, Gurgen Harutyunyan, T. Melkumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Application of defect injection flow for fault validation in memories. EWDTS (2013)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Impact of process variations on read failures in SRAMs. EWDTS (2013)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
An effective solution for building memory BIST infrastructure based on fault periodicity. VTS (2013)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (6) (2012)
Gurgen Harutunyan, Aram Hakhumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Symmetry Measure for Memory Test and Its Application in BIST Optimization. J. Electron. Test. 27 (6) (2011)
K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
A Robust Solution for Embedded Memory Test and Repair. Asian Test Symposium (2011)
Hayk T. Grigoryan, Gurgen Harutunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Generic BIST architecture for testing of content addressable memories. IOLTS (2011)
Alexander A. Letichevsky, Arsen S. Shoukourian, Samvel K. Shoukourian
The Equivalence Problem of Deterministic Multitape Finite Automata: A New Proof of Solvability Using a Multidimensional Tape. LATA (2010)
Armen Kostanyan, Vardan Matevosyan, Samvel K. Shoukourian, Anna Varosyan
An approach for formal verification of business processes. SpringSim (2009)
Haik Grigorian, Samvel K. Shoukourian
The equivalence problem of multidimensional multitape automata. J. Comput. Syst. Sci. 74 (7) (2008)
Levon Hayrapetyan, Samvel K. Shoukourian
Alternative Combination of Processes. PDPTA (2006)
Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure. IEEE Des. Test Comput. 21 (3) (2004)
Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
A Methodology for Design and Evaluation of Redundancy Allocation Algorithms. VTS (2004)
Yervant Zorian, Samvel K. Shoukourian
Embedded-Memory Test and Repair: Infrastructure IP for SoC Yield. IEEE Des. Test Comput. 20 (3) (2003)
Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
An Approach for Evaluation of Redunancy Analysis Algorithms. MTDT (2001)
Samvel K. Shoukourian, A. M. Vasilyan, A. A. Avagyan, A. K. Shukurian
An Approach for Access Differentiation Design in Medical Distributed Applications Built on Databases. MIE (1999)
Samvel K. Shoukourian
A Unified Design Methodology for Offline and Online Testing. IEEE Des. Test Comput. 15 (2) (1998)
Samvel K. Shoukourian, Armen G. Kostanian, Valery A. Margarian, Ayman A. Ashour
An approach for system tests design and its application. VTS (1995)