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Application of defect injection flow for fault validation in memories.

K. AmirkhanyanA. DavtyanGurgen HarutyunyanT. MelkumyanSamvel K. ShoukourianValery A. VardanianYervant Zorian
Published in: EWDTS (2013)
Keyphrases
  • neural network
  • fault diagnosis
  • data mining
  • image sequences
  • similarity measure
  • decision support