Login / Signup
Application of defect injection flow for fault validation in memories.
K. Amirkhanyan
A. Davtyan
Gurgen Harutyunyan
T. Melkumyan
Samvel K. Shoukourian
Valery A. Vardanian
Yervant Zorian
Published in:
EWDTS (2013)
Keyphrases
</>
neural network
fault diagnosis
data mining
image sequences
similarity measure
decision support