Valery A. Vardanian

Publication Activity (10 Years)

Years Active: 1985-2019
Publications (10 Years): 1

Top Topics

Localization Algorithm

Greedy Strategy

Fault Detection

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Karen Amirkhanyan, Valery A. Vardanian
On a Method for Segmentation of Memory Instances with Row Redundancies. EWDTS (2019)
Vrezh Sargsyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Avetik Yessayan
An efficient approach for memory repair by reducing the number of spares. EWDTS (2015)
Gurgen Harutyunyan, Grigor Tshagharyan, Valery A. Vardanian, Yervant Zorian
Fault modeling and test algorithm creation strategy for FinFET-based memories. VTS (2014)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Extending fault periodicity table for testing faults in memories under 20nm. EWDTS (2014)
T. Melkumyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters. EWDTS (2013)
K. Amirkhanyan, A. Davtyan, Gurgen Harutyunyan, T. Melkumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Application of defect injection flow for fault validation in memories. EWDTS (2013)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Impact of process variations on read failures in SRAMs. EWDTS (2013)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
An effective solution for building memory BIST infrastructure based on fault periodicity. VTS (2013)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (6) (2012)
Gurgen Harutunyan, Aram Hakhumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Symmetry Measure for Memory Test and Its Application in BIST Optimization. J. Electron. Test. 27 (6) (2011)
K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
A Robust Solution for Embedded Memory Test and Repair. Asian Test Symposium (2011)
Hayk T. Grigoryan, Gurgen Harutunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Generic BIST architecture for testing of content addressable memories. IOLTS (2011)
H. Avetisyan, Gurgen Harutyunyan, Valery A. Vardanian, Yervant Zorian
An efficient March test for detection of all two-operation dynamic faults from subclass Sav. EWDTS (2010)
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories. VTS (2008)
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
Minimal March Tests for Detection of Dynamic Faults in Random Access Memories. J. Electron. Test. 23 (1) (2007)
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
A March-based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories. DDECS (2007)
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
Minimal March-Based Fault Location Algorithm with Partial Diagnosis for all Static Faults in Random Access Memories. DDECS (2006)
T. A. Gyonjyan, Gurgen Harutunyan, Valery A. Vardanian
A March-Based Algorithm for Location and Full Diagnosis of All Unlinked Static Faults. MTDT (2006)
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
Minimal March Tests for Dynamic Faults in Random Access Memories. ETS (2006)
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories. VTS (2006)
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
Minimal March Tests for Unlinked Static Faults in Random Access Memories. VTS (2005)
Yervant Zorian, Valery A. Vardanian, K. Aleksanyan, K. Amirkhanyan
Impact of Soft Error Challenge on SoC Design. IOLTS (2005)
N. Derhacobian, Valery A. Vardanian, Yervant Zorian
Embedded Memory Reliability: The SER Challenge. MTDT (2004)
Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure. IEEE Des. Test Comput. 21 (3) (2004)
Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
A Methodology for Design and Evaluation of Redundancy Allocation Algorithms. VTS (2004)
Valery A. Vardanian, Yervant Zorian
A March-Based Fault Location Algorithm for Static Random Access Memories. MTDT (2002)
Valery A. Vardanian, Yervant Zorian
A March-Based Fault Location Algorithm for Static Random Access Memories. IOLTW (2002)
Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
An Approach for Evaluation of Redunancy Analysis Algorithms. MTDT (2001)
Valery A. Vardanian, Liana B. Mirzoyan
Improving the Error Detection Ability of Concurrent Checkers by Observation Point Insertion in the Circuit Under Check. DATE (2000)
Valery A. Vardanian
Exact probabilistic analysis of error detection for parity checkers. VTS (1997)
Valery A. Vardanian
On completely robust path delay fault testable realization of logic functions. VTS (1996)
Valery A. Vardanian
On the Complexity of Dynamic Tests for Logic Functions. Acta Cybern. 11 (4) (1994)
Valery A. Vardanian
On the complexity of terminal stuck-at fault detection tests for monotone Boolean functions. VTS (1994)
Valery A. Vardanian
On the length of single dynamic tests for monotone Boolean functions. FCT (1985)