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Hayk T. Grigoryan
Publication Activity (10 Years)
Years Active: 2011-2020
Publications (10 Years): 7
Top Topics
Memory Size
Growth Rate
Automotive Industry
Error Correction
Top Venues
ITC
EWDTS
VTS
IOLTS
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Publications
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Gabriele Boschi
,
Elisa Spano
,
Hayk T. Grigoryan
,
Arun Kumar
,
Gurgen Harutyunyan
Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications.
ITC
(2020)
Vazgen Sh. Melikyan
,
Artur Kh. Mkhitaryan
,
Hakob T. Kostanyan
,
Hayk T. Grigoryan
,
T. Kostanyan Harutyun
,
Mushegh T. Grigoryan
,
Ruben H. Musayelyan
,
Hayk V. Margaryan
Power Supply Noise Rejection Improvement Method in Modern VLSI Design.
EWDTS
(2019)
Gabriele Boschi
,
Donato Luongo
,
Duccio Lazzarotti
,
Hanna Shaheen
,
Hayk T. Grigoryan
,
Gurgen Harutyunyan
,
Samvel K. Shoukourian
,
Yervant Zorian
Memory FIT Rate Mitigation Technique for Automotive SoCs.
ITC
(2019)
S. Bandyopadhyay
,
J. Mekkoth
,
M. Hutner
,
Hayk T. Grigoryan
,
Arun Kumar
,
Samvel K. Shoukourian
,
Grigor Tshagharyan
,
Yervant Zorian
,
Gabriele Boschi
,
Duccio Lazzarotti
,
Donato Luongo
,
Hanna Shaheen
,
Gurgen Harutyunyan
Innovative Practices on In-System Test and Reliability of Memories.
VTS
(2019)
Sarath Mohanachandran Nair
,
Rajendra Bishnoi
,
Mehdi Baradaran Tahoori
,
Hayk T. Grigoryan
,
Grigor Tshagharyan
Variation-aware Fault Modeling and Test Generation for STT-MRAM.
IOLTS
(2019)
Sarath Mohanachandran Nair
,
Rajendra Bishnoi
,
Mehdi Baradaran Tahoori
,
Grigor Tshagharyan
,
Hayk T. Grigoryan
,
Gurgen Harutyunyan
,
Yervant Zorian
Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM.
ITC
(2018)
Hayk T. Grigoryan
,
Samvel K. Shoukourian
,
Gurgen Harutyunyan
,
Yervant Zorian
,
Costas Argyrides
Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs.
ITC
(2018)
Hayk T. Grigoryan
,
Gurgen Harutunyan
,
Samvel K. Shoukourian
,
Valery A. Vardanian
,
Yervant Zorian
Generic BIST architecture for testing of content addressable memories.
IOLTS
(2011)