Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM.
Sarath Mohanachandran NairRajendra BishnoiMehdi Baradaran TahooriGrigor TshagharyanHayk T. GrigoryanGurgen HarutyunyanYervant ZorianPublished in: ITC (2018)
Keyphrases
- preprocessing
- cost function
- learning algorithm
- improved algorithm
- simulated annealing
- high accuracy
- mathematical model
- k means
- neural network
- dynamic programming
- experimental evaluation
- detection algorithm
- optimization algorithm
- optimal solution
- matching algorithm
- significant improvement
- particle swarm optimization
- input data
- computational complexity
- worst case
- computational cost
- generation algorithm
- convex hull
- recognition algorithm
- path planning
- computationally efficient
- classification algorithm
- tree structure
- theoretical analysis
- probabilistic model
- np hard
- multi objective