Grigor Tshagharyan

Publication Activity (10 Years)

Years Active: 2014-2024
Publications (10 Years): 16

Top Topics

Lifecycle Management

Silicon Dioxide

External Memory

Top Venues

Publications

Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management. VTS (2024)
Artur Ghukasyan, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era. VTS (2023)
Keqing Ouyang, Minqiang Peng, Yunnong Zhu, Kang Qi, Grigor Tshagharyan, Arun Kumar, Gurgen Harutyunyan, Isaac Wang
An Efficient External Memory Test Solution: Case Study for HPC Application. VTS (2023)
Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI. ETS (2023)
Kranthi Kandula, Ramalingam Kolisetti, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor. ITC (2023)
Costas Argyrides, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
Utilizing ECC Analytics to Improve Memory Lifecycle Management. ITC (2023)
Mahta Mayahinia, Mehdi B. Tahoori, Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan
An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. ITC (2022)
Minqiang Peng, Youfa Wu, Jialiang Li, Alex Yu, Grigor Tshagharyan, Costas Argyrides, Vilas Sridharan, Gurgen Harutyunyan, Yervant Zorian, Nilanjan Mukherjee
Innovative Practices Track: What's Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety. VTS (2022)
S. Bandyopadhyay, J. Mekkoth, M. Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan
Innovative Practices on In-System Test and Reliability of Memories. VTS (2019)
Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Hayk T. Grigoryan, Grigor Tshagharyan
Variation-aware Fault Modeling and Test Generation for STT-MRAM. IOLTS (2019)
Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian
Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. ITC (2018)
Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori
Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications. ITC (2018)
Davit Hayrapetyan, Aleksandr Manukvan, Grigor Tshagharyan
Implementation of Memory Static, Coupling and Dynamic Fault Models at the Register Transfer Level. EWDTS (2018)
Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
An effective functional safety solution for automotive systems-on-chip. ITC (2017)
Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Experimental study on Hamming and Hsiao codes in the context of embedded applications. EWDTS (2017)
Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Securing test infrastructure of system-on-chips. EWDTS (2016)
Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Overview study on fault modeling and test methodology development for FinFET-based memories. EWDTS (2015)
Gurgen Harutyunyan, Grigor Tshagharyan, Yervant Zorian
Impact of parameter variations on FinFET faults. VTS (2015)
Gurgen Harutyunyan, Grigor Tshagharyan, Valery A. Vardanian, Yervant Zorian
Fault modeling and test algorithm creation strategy for FinFET-based memories. VTS (2014)