Fault modeling and test algorithm creation strategy for FinFET-based memories.
Gurgen HarutyunyanGrigor TshagharyanValery A. VardanianYervant ZorianPublished in: VTS (2014)
Keyphrases
- detection algorithm
- learning algorithm
- optimization algorithm
- k means
- experimental evaluation
- optimal solution
- computational complexity
- cost function
- dynamic programming
- improved algorithm
- objective function
- times faster
- search strategy
- linear programming
- simulated annealing
- single pass
- probabilistic model
- preprocessing
- high accuracy
- worst case
- recognition algorithm
- mathematical model
- monte carlo
- matching algorithm
- selection algorithm
- associative memory
- greedy strategy
- ant colony optimization
- clustering method
- theoretical analysis
- expectation maximization
- input data
- wavelet transform
- np hard