Gurgen Harutyunyan

Publication Activity (10 Years)

Years Active: 2010-2024
Publications (10 Years): 30

Top Topics

External Memory

Lifecycle Management

Top Venues

Publications

Fabian Vargas, Vache Galstyan, Gurgen Harutyunyan, Yervant Zorian
On-Chip Sensor to Monitor Aging Evolution in FinFET-Based Memories. IOLTS (2024)
Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management. VTS (2024)
Artur Ghukasyan, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era. VTS (2023)
Keqing Ouyang, Minqiang Peng, Yunnong Zhu, Kang Qi, Grigor Tshagharyan, Arun Kumar, Gurgen Harutyunyan, Isaac Wang
An Efficient External Memory Test Solution: Case Study for HPC Application. VTS (2023)
Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI. ETS (2023)
Kranthi Kandula, Ramalingam Kolisetti, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor. ITC (2023)
Costas Argyrides, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
Utilizing ECC Analytics to Improve Memory Lifecycle Management. ITC (2023)
Costas Argyrides, Vilas Sridharan, Hayk Danoyan, Gurgen Harutyunyan, Yervant Zorian
A Novel Protection Technique for Embedded Memories with Optimized PPA. ITC (2022)
Mahta Mayahinia, Mehdi B. Tahoori, Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan
An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. ITC (2022)
Minqiang Peng, Youfa Wu, Jialiang Li, Alex Yu, Grigor Tshagharyan, Costas Argyrides, Vilas Sridharan, Gurgen Harutyunyan, Yervant Zorian, Nilanjan Mukherjee
Innovative Practices Track: What's Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety. VTS (2022)
Gabriele Boschi, Elisa Spano, Hayk T. Grigoryan, Arun Kumar, Gurgen Harutyunyan
Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications. ITC (2020)
Gurgen Harutyunyan, Suren Martirosyan, Samvel K. Shoukourian, Yervant Zorian
Memory Physical Aware Multi-Level Fault Diagnosis Flow. IEEE Trans. Emerg. Top. Comput. 8 (3) (2020)
M. Casarsa, Gurgen Harutyunyan, Yervant Zorian
Test and Diagnosis Solution for Functional Safety. ITC (2020)
Gabriele Boschi, Donato Luongo, Duccio Lazzarotti, Hanna Shaheen, Hayk T. Grigoryan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Memory FIT Rate Mitigation Technique for Automotive SoCs. ITC (2019)
S. Bandyopadhyay, J. Mekkoth, M. Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan
Innovative Practices on In-System Test and Reliability of Memories. VTS (2019)
Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38 (3) (2019)
Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian
Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. ITC (2018)
M. Casarsa, Gurgen Harutyunyan
Case Study and Advanced Functional Safety Solution for Automotive SoCs. ITC (2018)
Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori
Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications. ITC (2018)
M. Casarsa, Gurgen Harutyunyan, Kaitlyn Chen, Ramesh Sharma, Giri Podichetty, Martin Keim, Sreejit Chakravarty, Ramesh C. Tekumalla
Innovative practices on memory test practice. VTS (2018)
Hayk T. Grigoryan, Samvel K. Shoukourian, Gurgen Harutyunyan, Yervant Zorian, Costas Argyrides
Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs. ITC (2018)
Tal Kogan, Yehonatan Abotbol, Gabriele Boschi, Gurgen Harutyunyan, N. Martirosyan, Yervant Zorian
Advanced Uniformed Test Approach For Automotive SoCs. ITC (2018)
Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
An effective functional safety solution for automotive systems-on-chip. ITC (2017)
Suren Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
An efficient testing methodology for embedded flash memories. EWDTS (2017)
Tal Kogan, Yehonatan Abotbol, Gabriele Boschi, Gurgen Harutyunyan, I. Kroul, Hanna Shaheen, Yervant Zorian
Advanced functional safety mechanisms for embedded memories and IPs in automotive SoCs. ITC (2017)
D. Sargsyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Automated flow for test pattern creation for IPs in SoC. EWDTS (2017)
Hanna Shaheen, Gabriele Boschi, Gurgen Harutyunyan, Yervant Zorian
Advanced ECC solution for automotive SoCs. IOLTS (2017)
Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Experimental study on Hamming and Hsiao codes in the context of embedded applications. EWDTS (2017)
Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Securing test infrastructure of system-on-chips. EWDTS (2016)
Gurgen Harutyunyan
Extending fault periodicity table for testing external memory faults. EWDTS (2016)
Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
Overview study on fault modeling and test methodology development for FinFET-based memories. EWDTS (2015)
Gurgen Harutyunyan, Grigor Tshagharyan, Yervant Zorian
Impact of parameter variations on FinFET faults. VTS (2015)
L. Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
A power based memory BIST grouping methodology. EWDTS (2015)
Gurgen Harutyunyan, Grigor Tshagharyan, Valery A. Vardanian, Yervant Zorian
Fault modeling and test algorithm creation strategy for FinFET-based memories. VTS (2014)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Extending fault periodicity table for testing faults in memories under 20nm. EWDTS (2014)
T. Melkumyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters. EWDTS (2013)
W. Prates, Letícia Maria Veiras Bolzani, Gurgen Harutyunyan, A. Davtyan, Fabian Vargas, Yervant Zorian
Integrating embedded test infrastructure in SRAM cores to detect aging. IOLTS (2013)
K. Amirkhanyan, A. Davtyan, Gurgen Harutyunyan, T. Melkumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Application of defect injection flow for fault validation in memories. EWDTS (2013)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Impact of process variations on read failures in SRAMs. EWDTS (2013)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
An effective solution for building memory BIST infrastructure based on fault periodicity. VTS (2013)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (6) (2012)
K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
A Robust Solution for Embedded Memory Test and Repair. Asian Test Symposium (2011)
H. Avetisyan, Gurgen Harutyunyan, Valery A. Vardanian, Yervant Zorian
An efficient March test for detection of all two-operation dynamic faults from subclass Sav. EWDTS (2010)