Letícia Maria Veiras Bolzani

Publication Activity (10 Years)

Years Active: 2003-2024
Publications (10 Years): 11

Top Topics

Hierarchical Classification

Surface Defects

Completely Automated

Manufacturing Process

Top Venues

Microelectron. Reliab.

Publications

Rebecca Pelke, Felix Staudigl, Niklas Thomas, Nils Bosbach, Mohammed Hossein, José Cubero-Cascante, Letícia Maria Veiras Bolzani, Rainer Leupers, Jan Moritz Joseph
A Fully Automated Platform for Evaluating ReRAM Crossbars. LATS (2024)
Thiago Copetti, A. Chordia, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Veiras Bolzani
Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs. LATS (2024)
Thiago Santos Copetti, A. Castelnuovo, Tobias Gemmeke, Letícia Maria Veiras Bolzani
Evaluating a New RRAM Manufacturing Test Strategy. LATS (2023)
Letícia Maria Veiras Bolzani
Embedded Tutorial - RRAMs: How to Guarantee Their Quality Test after Manufacturing? DDECS (2023)
Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Maria Veiras Bolzani, Said Hamdioui
Hierarchical Memory Diagnosis. ETS (2022)
Thiago Santos Copetti, Tobias Gemmeke, Letícia Maria Veiras Bolzani
Validating a DFT Strategy's Detection Capability regarding Emerging Faults in RRAMs. VLSI-SoC (2021)
Letícia Maria Veiras Bolzani, Moritz Fieback, Susanne Hoffmann-Eifert, Thiago Copetti, E. Brum, Stephan Menzel, Said Hamdioui, Tobias Gemmeke
Review of Manufacturing Process Defects and Their Effects on Memristive Devices. J. Electron. Test. 37 (4) (2021)
E. Brum, Moritz Fieback, Thiago Santos Copetti, H. Jiayi, Said Hamdioui, Fabian Vargas, Letícia Maria Veiras Bolzani
Evaluating the Impact of Process Variation on RRAMs. LATS (2021)
G. Cardoso Medeiros, Letícia Maria Veiras Bolzani, Mottaqiallah Taouil, Fabian Vargas, Said Hamdioui
A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs. Microelectron. Reliab. (2018)
Roger C. Goerl, Paulo Ricardo Cechelero Villa, Letícia Maria Veiras Bolzani, Eduardo Augusto Bezerra, Fabian Luis Vargas
An efficient EDAC approach for handling multiple bit upsets in memory array. Microelectron. Reliab. (2018)
Andres F. Gomez, Felipe Lavratti, Guilherme Medeiros Machado, M. Sartori, Letícia Maria Veiras Bolzani, Víctor H. Champac, Fabian Vargas
Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations. Microelectron. Reliab. 67 (2016)
W. Prates, Letícia Maria Veiras Bolzani, Gurgen Harutyunyan, A. Davtyan, Fabian Vargas, Yervant Zorian
Integrating embedded test infrastructure in SRAM cores to detect aging. IOLTS (2013)
Felipe Lavratti, Letícia Maria Veiras Bolzani, Andrea Calimera, Fabian Vargas, Enrico Macii
Technique based on On-Chip Current Sensors and Neighbourhood Comparison Logic to detect resistive-open defects in SRAMs. LATW (2013)
Arthur Ceratti, Thiago Copetti, Letícia Maria Veiras Bolzani, Fabian Vargas
Investigating the use of an on-chip sensor to monitor NBTI effect in SRAM. LATW (2012)
Felipe Lavratti, Andrea Calimera, Letícia Maria Veiras Bolzani, Fabian Vargas, Enrico Macii
A new Built-In Current Sensor scheme to detect dynamic faults in Nano-Scale SRAMs. LATW (2011)
Dhiego Silva, Letícia Maria Veiras Bolzani, Fabian Vargas
An intellectual property core to detect task schedulling-related faults in RTOS-based embedded systems. IOLTS (2011)
Dhiego Silva, K. Stangherlin, Letícia Maria Veiras Bolzani, Fabian Vargas
A Hardware-Based Approach for Fault Detection in RTOS-Based Embedded Systems. ETS (2011)
Raul Chipana, Letícia Maria Veiras Bolzani, Fabian Vargas, Jorge Semião, Juan J. Rodríguez-Andina, Isabel C. Teixeira, João Paulo Teixeira
Investigating the Use of BICS to detect resistive-open defects in SRAMs. IOLTS (2010)
Felipe Lavratti, Alex R. Pinto, Letícia Maria Veiras Bolzani, Fabian Vargas, Carlos Barros Montez, Fernando Hernandez, Edmundo Gatti, C. Silva
Evaluating a Transmission Power Self-Optimization Technique for WSN in EMI Environments. DSD (2010)
Felipe Lavratti, Alex R. Pinto, Dárcio Prestes, Letícia Maria Veiras Bolzani, Fabian Vargas, Carlos Montez
Towards a transmission power self-optimization in reliable Wireless Sensor Networks. LATW (2010)
Raul Chipana, Letícia Maria Veiras Bolzani, Fabian Vargas
BICS-based March test for resistive-open defect detection in SRAMs. LATW (2010)
Letícia Maria Veiras Bolzani, Andrea Calimera, Alberto Macii, Enrico Macii, Massimo Poncino
Enabling concurrent clock and power gating in an industrial design flow. DATE (2009)
Letícia Maria Veiras Bolzani, Andrea Calimera, Alberto Macii, Enrico Macii, Massimo Poncino
Placement-aware Clustering for Integrated Clock and Power Gating. ISCAS (2009)
Enrico Macii, Letícia Maria Veiras Bolzani, Andrea Calimera, Alberto Macii, Massimo Poncino
Integrating Clock Gating and Power Gating for Combined Dynamic and Leakage Power Optimization in Digital CMOS Circuits. DSD (2008)
Letícia Maria Veiras Bolzani, Paolo Bernardi, Matteo Sonza Reorda
An optimized hybrid approach to provide fault detection and correction in SoCs. SBCCI (2007)
Paolo Bernardi, Letícia Maria Veiras Bolzani, Matteo Sonza Reorda
A Hybrid Approach to Fault Detection and Correction in SoCs. IOLTS (2007)
Letícia Maria Veiras Bolzani, Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero
Coupling EA and high-level metrics for the automatic generation of test blocks for peripheral cores. GECCO (2007)
Letícia Maria Veiras Bolzani, Ernesto Sánchez, Massimiliano Schillaci, Matteo Sonza Reorda, Giovanni Squillero
An Automated Methodology for Cogeneration of Test Blocks for Peripheral Cores. IOLTS (2007)
Paolo Bernardi, Letícia Maria Veiras Bolzani, Matteo Sonza Reorda
Extended Fault Detection Techniques for Systems-on-Chip. DDECS (2007)
Letícia Maria Veiras Bolzani, Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero
Co-evolution of test programs and stimuli vectors for testing of embedded peripheral cores. IEEE Congress on Evolutionary Computation (2007)
Letícia Maria Veiras Bolzani, Edgar E. Sánchez, Matteo Sonza Reorda
A software-based methodology for the generation of peripheral test sets based on high-level descriptions. SBCCI (2007)
Paolo Bernardi, Letícia Maria Veiras Bolzani, Alberto Manzone, Massimo Osella, Massimo Violante, Matteo Sonza Reorda
Software-Based On-Line Test of Communication Peripherals in Processor-Based Systems for Automotive Applications. MTV (2006)
Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante
A New Hybrid Fault Detection Technique for Systems-on-a-Chip. IEEE Trans. Computers 55 (2) (2006)
Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante
An Integrated Approach for Increasing the Soft-Error Detection Capabilities in SoCs processors. DFT (2005)
Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante
On-Line Detection of Control-Flow Errors in SoCs by Means of an Infrastructure IP Core. DSN (2005)
Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante
Hybrid Soft Error Detection by Means of Infrastructure IP Cores. IOLTS (2004)
Fabian Vargas, Diogo B. Brum, Dárcio Prestes, Letícia Maria Veiras Bolzani, Eduardo Luis Rhod, Matteo Sonza Reorda
Introducing SW-Based Fault Handling Mechanisms to Cope with EMI in Embedded Electronics: Are They A Good Remedy? IOLTS (2003)