Andres F. Gomez

Publication Activity (10 Years)

Years Active: 2015-2019
Publications (10 Years): 10

Top Topics

Robust Detection

Battery Powered

Top Venues

J. Electron. Test.

Publications

Andres F. Gomez, Víctor H. Champac
An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects. J. Electron. Test. 35 (1) (2019)
Víctor H. Champac, Andres F. Gomez, Freddy Forero, Kaushik Roy
Analysis of Bridge Defects in STT-MRAM Cells Under Process Variations and a Robust DFT Technique for Their Detection. VLSI-SoC (Selected Papers) (2018)
Andres F. Gomez, Víctor H. Champac
Selection of Critical Paths for Reliable Frequency Scaling under BTI-Aging Considering Workload Uncertainty and Process Variations Effects. ACM Trans. Design Autom. Electr. Syst. 23 (3) (2018)
Andres F. Gomez, Freddy Forero, Kaushik Roy, Víctor H. Champac
Robust Detection of Bridge Defects in STT-MRAM Cells Under Process Variations. VLSI-SoC (2018)
Andres F. Gomez, Roberto Gómez, Víctor H. Champac
A metric-guided gate-sizing methodology for aging guardband reduction. LATS (2018)
Andres F. Gomez, Felipe Lavratti, Guilherme Medeiros Machado, M. Sartori, Letícia Maria Veiras Bolzani, Víctor H. Champac, Fabian Vargas
Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations. Microelectron. Reliab. 67 (2016)
Andres F. Gomez, Víctor H. Champac
Early Selection of Critical Paths for Reliable NBTI Aging-Delay Monitoring. IEEE Trans. Very Large Scale Integr. Syst. 24 (7) (2016)
Andres F. Gomez, Víctor H. Champac
Critical path selection under NBTI/PBTI aging for adaptive frequency tuning. EWDTS (2016)
Freddy Forero, Andres F. Gomez, Víctor H. Champac
Improvement of Negative Bias Temperature Instability Circuit Reliability and Power Consumption Using Dual Supply Voltage. J. Low Power Electron. 12 (4) (2016)
Freddy Forero, Andres F. Gomez, Víctor H. Champac
A methodology for NBTI circuit reliability at reduced power consumption using dual supply voltage. LATS (2016)
Víctor H. Champac, Alejandra Nicte-ha Reyes, Andres F. Gomez
Circuit performance optimization for local intra-die process variations using a gate selection metric. VLSI-SoC (2015)
Andres F. Gomez, Víctor H. Champac
Effective selection of favorable gates in BTI-critical paths to enhance circuit reliability. LATS (2015)
Andres F. Gomez, Víctor H. Champac
A new sizing approach for lifetime improvement of nanoscale digital circuits due to BTI aging. VLSI-SoC (2015)
Andres F. Gomez, Leticia B. Poehls, Fabian Vargas, Víctor H. Champac
An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging. VTS (2015)