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Robust Detection of Bridge Defects in STT-MRAM Cells Under Process Variations.

Andres F. GomezFreddy ForeroKaushik RoyVíctor H. Champac
Published in: VLSI-SoC (2018)
Keyphrases
  • robust detection
  • neural network
  • real time
  • data sets
  • data structure
  • object recognition
  • feature detection