FEATURE DETECTION
Experts
- Tony Lindeberg
- Luc Florack
- Yang Liu
- Bart M. ter Haar Romeny
- Salvatore Tabbone
- Max A. Viergever
- Wei Zhang
- Yong Liu
- Shoaib Ehsan
- Klaus D. McDonald-Maier
- Wei Wang
- Bo Zhang
- Pietro Perona
- Naveed ur Rehman
- Atsushi Imiya
- Michael Unser
- Wei Zhao
- Jean-Michel Morel
- Sei-ichiro Kamata
- Hao Wang
- Edwin R. Hancock
- Hong Wang
- Gerald Sommer
- Tomoya Sakai
- Arjan Kuijper
- Hui Wang
- J. Andrew Bangham
- Nicolas Normand
- Andrew Kingston
- Andrew Zisserman
- Bryan W. Scotney
- H. Vincent Poor
- Fan Zhang
- Sonya A. Coleman
- Jiri Matas
- Chen Chen
- Luc Van Gool
- V. Javier Traver
- Theo Gevers
Venues
- CoRR
- Sensors
- IEEE Access
- Remote. Sens.
- IGARSS
- Multim. Tools Appl.
- ICIP
- ICASSP
- IEEE Trans. Geosci. Remote. Sens.
- CVPR
- IEEE Trans. Instrum. Meas.
- Pattern Recognit.
- ICPR
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Trans. Image Process.
- EMBC
- ICCV
- 计算机科学
- ICRA
- IROS
- ITSC
- EUSIPCO
- IEEE Trans. Intell. Transp. Syst.
- Image Vis. Comput.
- Comput. Electron. Agric.
- Expert Syst. Appl.
- Neurocomputing
- Int. J. Comput. Vis.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- IET Image Process.
- J. Electronic Imaging
- SMC
- Signal Image Video Process.
- Scale-Space
- SIU
- Int. J. Pattern Recognit. Artif. Intell.
- Comput. Vis. Image Underst.
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