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Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations.

Andres F. GomezFelipe LavrattiGuilherme Medeiros MachadoM. SartoriLetícia Maria Veiras BolzaniVíctor H. ChampacFabian Vargas
Published in: Microelectron. Reliab. (2016)
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