Fabian Vargas

Publication Activity (10 Years)

Years Active: 1995-2024
Publications (10 Years): 31

Top Venues

LATS

J. Electron. Test.

Microelectron. Reliab.

VLSI Design

Publications

Fabian Vargas, Vache Galstyan, Gurgen Harutyunyan, Yervant Zorian
On-Chip Sensor to Monitor Aging Evolution in FinFET-Based Memories. IOLTS (2024)
Rizwan Tariq Syed, Fabian Vargas, Marko S. Andjelkovic, Markus Ulbricht, Milos Krstic
Aging and Soft Error Resilience in Reconfigurable CNN Accelerators Employing a Multi-Purpose On-Chip Sensor. LATS (2024)
Diana Göhringer, Ariel Podlubne, Fabian Vargas, Milos Krstic
Self-Aware Reliable and Reconfigurable Computing Systems - An Overview. IPDPS (Workshops) (2024)
Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura
Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations. J. Electron. Test. 40 (1) (2024)
Fabian Vargas, Milos Krstic, Marko S. Andjelkovic, Markus Ulbricht, Junchao Chen
Silicon Lifecycle Management Based on On-Chip Cross-Layer Sensing and Analytics for Space Applications. LATS (2024)
Marko S. Andjelkovic, Junchao Chen, Rizwan Tariq Syed, Fabian Vargas, Markus Ulbricht, Milos Krstic, Stefan D. Ilic, Milos Marjanovic, Sandra Veljkovic, Nikola Mitrovic, Danijel Dankovic, Goran S. Ristic, Russell Duane, Nikola Vasovic, Aleksandar Jaksic, Alberto J. Palma, Antonio M. Lallena, Miguel A. Carvajal
Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System. DSD (2023)
Fabian Vargas, Douglas Borba, Juliano Benfica, Rizwan Tariq Syed
Artificial Neural Network Accelerator for Classification of In-Field Conducted Noise in Integrated Circuits' DC Power Lines. IOLTS (2023)
Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura
Failure Probability due to Radiation-induced Effects in FinFET SRAM Cells under Process Variations. LATS (2022)
Víctor H. Champac, Javier Mesalles, Hector Villacorta, Fabian Vargas
Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell. J. Electron. Test. 37 (3) (2021)
E. Brum, Moritz Fieback, Thiago Santos Copetti, H. Jiayi, Said Hamdioui, Fabian Vargas, Letícia Maria Veiras Bolzani
Evaluating the Impact of Process Variation on RRAMs. LATS (2021)
David C. C. Freitas, David F. M. Mota, Roger C. Goerl, César A. M. Marcon, Fabian Vargas, Jarbas A. N. Silveira, João Cesar M. Mota
PCoSA: A product error correction code for use in memory devices targeting space applications. Integr. 74 (2020)
Raphael Segabinazzi Ferreira, Jörg Nolte, Fabian Vargas, Nevin George, Michael Hübner
Run-time Hardware Reconfiguration of Functional Units to Support Mixed-Critical Applications. LATS (2020)
Zahira Perez, Javier Mesalles, Hector Villacorta, Fabian Vargas, Víctor H. Champac
Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells. LATS (2020)
Estevan Lara, Guilherme Debon, Roger C. Goerl, Paulo Ricardo Cechelero Villa, Dorian Schramm, Leticia B. Poehls, Fabian Vargas
A New Approach to Guarantee Critical Task Schedulability in TDMA-Based Bus Access of Multicore Architecture. LATS (2019)
Renato Severo, Celso Maciel da Costa, Adriane Parraga, Debora Motta, Ivan Müller, Fabian Vargas
Design and test of the RT-NKE task scheduling algorithm for multicore architectures. LATS (2018)
Felipe G. A. e Silva, Jardel Silveira, Jarbas Silveira, César A. M. Marcon, Fabian Vargas, Otávio Alcântara de Lima Jr.
An Extensible Code for Correcting Multiple Cell Upset in Memory Arrays. J. Electron. Test. 34 (4) (2018)
G. Cardoso Medeiros, Letícia Maria Veiras Bolzani, Mottaqiallah Taouil, Fabian Vargas, Said Hamdioui
A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs. Microelectron. Reliab. (2018)
George Redivo Pinto, Guilherme Cardoso Medeiros, Fabian Vargas, Leticia Bolzani Poehls
A hardware-based approach for SEU monitoring in SRAMs with weak resistive defects. LATS (2018)
F. Tubiello, Leticia Bolzani Poehls, Thais Webber, César Augusto Missio Marcon, Fabian Vargas
A path energy control technique for energy efficiency on wireless sensor networks. LASCAS (2018)
Felipe G. H. Leite, Roberto B. B. Santos, Nilberto H. Medina, Vitor A. P. Aguiar, Renato C. Giacomini, Nemitala Added, Fernando Aguirre, Eduardo L. A. Macchione, Fabian Vargas, Marcilei Aparecida Guazzelli da Silveira
Ionizing radiation effects on a COTS low-cost RISC microcontroller. LATS (2017)
Felipe G. A. e Silva, Otávio A. de Lima, Walter da C. Freitas, Fabian Vargas, Jarbas Silveira, César A. M. Marcon
An efficient, low-cost ECC approach for critical-application memories. SBCCI (2017)
M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Marcus Pohls
Analysing NBTI Impact on SRAMs with Resistive Defects. J. Electron. Test. 33 (5) (2017)
Paulo Ricardo Cechelero Villa, Roger C. Goerl, Fabian Vargas, Leticia B. Poehls, Nilberto H. Medina, Nemitala Added, Vitor A. P. de Aguiar, Eduardo L. A. Macchione, Fernando Aguirre, Marcilei Aparecida Guazzelli da Silveira, Eduardo Augusto Bezerra
Analysis of single-event upsets in a Microsemi ProAsic3E FPGA. LATS (2017)
G. Cardoso Medeiros, Letícia Maria Bolzani Pöhls, Fabian Vargas
Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects. VLSI Design (2016)
Andres F. Gomez, Felipe Lavratti, Guilherme Medeiros Machado, M. Sartori, Letícia Maria Veiras Bolzani, Víctor H. Champac, Fabian Vargas
Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations. Microelectron. Reliab. 67 (2016)
Adelcio Biazi, César A. M. Marcon, Fauzi de M. Shubeita, Leticia B. Poehls, Thais Webber, Fabian Vargas
A dynamic TDMA-based sleep scheduling to minimize WSN energy consumption. ICNSC (2016)
Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros
Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits. J. Electron. Test. 32 (3) (2016)
M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Poehls
Analyzing NBTI impact on SRAMs with resistive-open defects. LATS (2016)
Odilson T. Valle, Gerson F. Budke, Carlos Montez, Alex R. Pinto, Fernando Hernandez, Francisco Vasques, Fabian Vargas, Edmundo Gatti
Experimental assessment of using network coding and cooperative diversity techniques in IEEE 802.15.4 wireless sensor networks. WFCS (2016)
Thiago Copetti, Guilherme Medeiros Machado, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar
Gate-level modelling of NBTI-induced delays under process variations. LATS (2016)
Thiago Copetti, Guilherme Cardoso Medeiros, Leticia Bolzani Poehls, Fabian Vargas
NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time. J. Electron. Test. 32 (3) (2016)
Raphael Segabinazzi Ferreira, Fabian Vargas
ShadowStack: A new approach for secure program execution. Microelectron. Reliab. 55 (9-10) (2015)
Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Pöhls
SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic. DDECS (2015)
N. Palermo, Valentin Tihhomirov, Thiago Santos Copetti, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Marco Gaudesi, Giovanni Squillero, Matteo Sonza Reorda, Fabian Vargas, Letícia Maria Bolzani Pöhls
Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG. LATS (2015)
Felipe Lavratti, Letícia Maria Bolzani Poehls, Fabian Vargas, Andrea Calimera, Enrico Macii
Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects in SRAMs. VLSI Design (2015)
Christofer de Oliveira, Leticia Bolzani Poehls, Fabian Vargas
On-chip Watchdog to monitor RTOS activity in MPSoC exposed to noisy environment. EMC Compo (2015)
Thiago Copetti, G. Cardoso Medeiros, Letícia Maria Bolzani Poehls, Fabian Vargas
NBTI-aware design of integrated circuits: a hardware-based approach. LATS (2015)
Andres F. Gomez, Leticia B. Poehls, Fabian Vargas, Víctor H. Champac
An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging. VTS (2015)
Pablo Briff, Ariel Lutenberg, Leonardo Rey Vega, Fabian Vargas, Mohammad Patwary
A Primer on Energy-Efficient Synchronization of WSN Nodes over Correlated Rayleigh Fading Channels. IEEE Wirel. Commun. Lett. 3 (1) (2014)
Arthur Ceratti, Thiago Copetti, Letícia Maria Bolzani Poehls, Fabian Vargas, Rubem Dutra Ribeiro Fagundes
An On-Chip Sensor to Monitor NBTI Effects in SRAMs. J. Electron. Test. 30 (2) (2014)
Pablo Briff, Ariel Lutenberg, Leonardo Rey Vega, Fabian Vargas, Mohammad Patwary
A novel control strategy for fail-safe cyclic data exchange in wireless sensor networks. LATW (2014)
Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Fabian Vargas, Letícia Maria Bolzani Poehls, Thiago Santos Copetti
Hierarchical identification of NBTI-critical gates in nanoscale logic. LATW (2014)
Raimund Ubar, Fabian Vargas, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Letícia Maria Bolzani Poehls
Identifying NBTI-Critical Paths in Nanoscale Logic. DSD (2013)
W. Prates, Letícia Maria Veiras Bolzani, Gurgen Harutyunyan, A. Davtyan, Fabian Vargas, Yervant Zorian
Integrating embedded test infrastructure in SRAM cores to detect aging. IOLTS (2013)
Felipe Lavratti, Letícia Maria Veiras Bolzani, Andrea Calimera, Fabian Vargas, Enrico Macii
Technique based on On-Chip Current Sensors and Neighbourhood Comparison Logic to detect resistive-open defects in SRAMs. LATW (2013)
Carlos Leong, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira, María Dolores Valdés, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas
Aging monitoring with local sensors in FPGA-based designs. FPL (2013)
C. Oliveira, Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez, Alexandre Boyer
Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI. EMC Compo (2013)
Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez
A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation. J. Electron. Test. 28 (6) (2012)
Marta Portela-García, Almudena Lindoso, Luis Entrena, Mario García-Valderas, Celia López-Ongil, N. Marroni, Bernardo Pianta, Letícia Maria Bolzani Poehls, Fabian Vargas
Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach. J. Electron. Test. 28 (6) (2012)
Arthur Ceratti, Thiago Copetti, Letícia Maria Bolzani Poehls, Fabian Vargas
On-chip aging sensor to monitor NBTI effect in nano-scale SRAM. DDECS (2012)
Judit Freijedo, Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira
Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits. J. Electron. Test. 28 (4) (2012)
Arthur Ceratti, Thiago Copetti, Letícia Maria Veiras Bolzani, Fabian Vargas
Investigating the use of an on-chip sensor to monitor NBTI effect in SRAM. LATW (2012)
Costas Argyrides, Raul Chipana, Fabian Vargas, Dhiraj K. Pradhan
Reliability Analysis of H-Tree Random Access Memories Implemented With Built in Current Sensors and Parity Codes for Multiple Bit Upset Correction. IEEE Trans. Reliab. 60 (3) (2011)
Carlos Ivan Castro Marquez, Marius Strum, Wang Jiang Chau, Fabian Vargas
Formally verifying an RTOS scheduling monitor IP core in embedded systems. LATW (2011)
Felipe Lavratti, Andrea Calimera, Letícia Maria Veiras Bolzani, Fabian Vargas, Enrico Macii
A new Built-In Current Sensor scheme to detect dynamic faults in Nano-Scale SRAMs. LATW (2011)
Víctor H. Champac, Fernanda Gusmão de Lima Kastensmidt, Letícia Maria Veiras Bolzani Poehls, Fabian Vargas, Yervant Zorian
12th "IEEE Latin-American Test Workshop" Porto de Galinhas, Brazil, 27-30 March 2011. J. Low Power Electron. 7 (4) (2011)
Vasco Bexiga, Carlos Leong, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira, María Dolores Valdés, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas
Performance Failure Prediction Using Built-In Delay Sensors in FPGAs. FPL (2011)
Judit Freijedo, María Dolores Valdés, Lucía Costas, María José Moure, Juan J. Rodríguez-Andina, Jorge Semião, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira
Operation of FPGA-Based Digital Circuits Through Delay Modeling and Time Borrowing. J. Low Power Electron. 7 (2) (2011)
Marta Portela-García, Almudena Lindoso, Luis Entrena, Mario García-Valderas, Celia López-Ongil, Bernardo Pianta, Letícia Maria Bolzani Poehls, Fabian Vargas
Using an FPGA-based fault injection technique to evaluate software robustness under SEEs: A case study. LATW (2011)
Dhiego Silva, Letícia Maria Veiras Bolzani, Fabian Vargas
An intellectual property core to detect task schedulling-related faults in RTOS-based embedded systems. IOLTS (2011)
Judit Freijedo, Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira
Modeling the effect of process variations on the timing response of nanometer digital circuits. LATW (2011)
Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Sebastián E. García, Edmundo Gatti, Fernando Hernandez, Ney Laert Vilar Calazans
Configurable platform for IC combined tests of total-ionizing dose radiation and electromagnetic immunity. LATW (2011)
Dhiego Silva, K. Stangherlin, Letícia Maria Veiras Bolzani, Fabian Vargas
A Hardware-Based Approach for Fault Detection in RTOS-Based Embedded Systems. ETS (2011)
María Dolores Valdés, Judit Freijedo, María José Moure, Juan J. Rodríguez-Andina, Jorge Semião, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira
Programmable sensor for on-line checking of signal integrity in FPGA-based systems subject to aging effects. LATW (2011)
Raul Chipana, Letícia Maria Veiras Bolzani, Fabian Vargas, Jorge Semião, Juan J. Rodríguez-Andina, Isabel C. Teixeira, João Paulo Teixeira
Investigating the Use of BICS to detect resistive-open defects in SRAMs. IOLTS (2010)
Felipe Lavratti, Alex R. Pinto, Letícia Maria Veiras Bolzani, Fabian Vargas, Carlos Barros Montez, Fernando Hernandez, Edmundo Gatti, C. Silva
Evaluating a Transmission Power Self-Optimization Technique for WSN in EMI Environments. DSD (2010)
Felipe Lavratti, Alex R. Pinto, Dárcio Prestes, Letícia Maria Veiras Bolzani, Fabian Vargas, Carlos Montez
Towards a transmission power self-optimization in reliable Wireless Sensor Networks. LATW (2010)
Raul Chipana, Letícia Maria Veiras Bolzani, Fabian Vargas
BICS-based March test for resistive-open defect detection in SRAMs. LATW (2010)
Judit Freijedo, Lucía Costas, Jorge Semião, Juan J. Rodríguez-Andina, María José Moure, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira
Impact of Power Supply Voltage Variations on FPGA-Based Digital Systems Performance. J. Low Power Electron. 6 (2) (2010)
Jimmy Tarrillo, Letícia Maria Veiras Bolzani Poehls, Fabian Vargas
A Hardware-Scheduler for Fault Detection in RTOS-Based Embedded Systems. DSD (2009)
Jorge Semião, Judit Freijedo, Marlon Moraes, M. Mallmann, C. Antunes, Juliano Benfica, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Juan J. Rodríguez-Andina, João Paulo Teixeira, D. Lupi, Edmundo Gatti, L. Garcia, Fernando Hernandez
Measuring clock-signal modulation efficiency for Systems-on-Chip in electromagnetic interference environment. LATW (2009)
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies. IOLTS (2009)
Fabian Vargas, Claudia A. Rocha, Bernardo Pianta, Marta Portela-García, Celia López-Ongil, Mario García-Valderas, Luis Entrena
Briefing power/reliability optimization in embedded software design. IOLTS (2009)
Judit Freijedo, Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira
Delay Modeling for Power Noise and Temperature-Aware Design and Test of Digital Systems. J. Low Power Electron. 4 (3) (2008)
Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits. DDECS (2008)
Jorge Semião, Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Leonardo Bisch Piccoli, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira
Signal Integrity Enhancement in Digital Circuits. IEEE Des. Test Comput. 25 (5) (2008)
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits. IOLTS (2008)
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Time Management for Low-Power Design of Digital Systems. J. Low Power Electron. 4 (3) (2008)
Costas Argyrides, Fabian Vargas, Marlon Moraes, Dhiraj K. Pradhan
Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement. IOLTS (2008)
Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira
Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations. DFT (2007)
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits. IOLTS (2007)
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits. DDECS (2007)
Fabian Vargas, Leonardo Piccoli, Juliano Benfica, Antonio A. de Alecrim Jr., Marlon Moraes
Time-Sensitive Control-Flow Checking for Multitask Operating System-Based SoCs. IOLTS (2007)
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Enhancing the Tolerance to Power-Supply Instability in Digital Circuits. ISVLSI (2007)
Fabian Vargas
Design and test on chip for EMC. IEEE Des. Test Comput. 23 (6) (2006)
Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira
Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes. IOLTS (2006)
Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira
Using Multiple Clock Schemes and Multi-Temperature Test for Dynamic Fault Detection in Digital Systems. LATW (2006)
Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante
A New Hybrid Fault Detection Technique for Systems-on-a-Chip. IEEE Trans. Computers 55 (2) (2006)
Fabian Vargas, Leonardo Picolli, Antonio A. de Alecrim Jr., Marlon Moraes, Marcio Gama
Summarizing a time-sensitive control-flow checking monitoring for multitask systems-on-chip. FPT (2006)
Fabian Vargas, Juliano Benfica, A. Farina, Eduardo Bezerra, Edmundo Gatti, L. Garcia, D. Lupi, Fernando Hernandez
Observing SRAM-based FPGA Robustness in EMI-exposed Environments. LATW (2006)
Fabian Vargas
2006 Latin American Test Workshop. IEEE Des. Test Comput. 23 (3) (2006)
Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante
On-Line Detection of Control-Flow Errors in SoCs by Means of an Infrastructure IP Core. DSN (2005)
D. Barros Júnior, Marcial Jesús Rodríguez-Irago, Marcelino B. Santos, Isabel C. Teixeira, Fabian Vargas, João Paulo Teixeira
Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip. J. Electron. Test. 21 (4) (2005)
Fabian Vargas, D. L. Cavalcante, Edmundo Gatti, Dárcio Prestes, D. Lupi
On the Proposition of an EMI-Based Fault Injection Approach. IOLTS (2005)
Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test. IOLTS (2005)
Daniel Barros Jr., Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Modeling and Simulation of Time Domain Faults in Digital Systems. IOLTS (2004)
Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr., Diogo B. Brum, Eduardo Luis Rhod
Merging a DSP-Oriented Signal Integrity Technique and SW-Based Fault Handling Mechanisms to Ensure Reliable DSP Systems. J. Electron. Test. 20 (4) (2004)
Fabian Vargas, Víctor H. Champac
Guest Editorial. J. Electron. Test. 20 (4) (2004)
Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante
Hybrid Soft Error Detection by Means of Infrastructure IP Cores. IOLTS (2004)
Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.
A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems. J. Electron. Test. 19 (1) (2003)

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Publication Activity (10 Years)

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Fabian Vargas