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Ionizing radiation effects on a COTS low-cost RISC microcontroller.

Felipe G. H. LeiteRoberto B. B. SantosNilberto H. MedinaVitor A. P. AguiarRenato C. GiacominiNemitala AddedFernando AguirreEduardo L. A. MacchioneFabian VargasMarcilei Aparecida Guazzelli da Silveira
Published in: LATS (2017)
Keyphrases
  • registration errors
  • low cost
  • low power consumption
  • ionizing radiation
  • low power
  • real time
  • single chip
  • application specific
  • low dose
  • x ray
  • data analysis