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Investigating the Use of BICS to detect resistive-open defects in SRAMs.
Raul Chipana
Letícia Maria Veiras Bolzani
Fabian Vargas
Jorge Semião
Juan J. Rodríguez-Andina
Isabel C. Teixeira
João Paulo Teixeira
Published in:
IOLTS (2010)
Keyphrases
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detection algorithm
automatic detection
detection method
multi agent
relational databases
multiresolution
defect detection
information retrieval
image processing
multimedia
decision trees
database systems
object recognition
medical images
machine vision
defect classification