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Jorge Semião
ORCID
Publication Activity (10 Years)
Years Active: 1999-2022
Publications (10 Years): 10
Top Topics
Field Programmable Gate Array
Energy Management
Fiber Bragg Grating
Business Objects
Top Venues
HCI (8)
IECON
GISTAM (Selected Papers)
LATS
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Publications
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Jorge Semião
,
Luís Santos
,
Marcelino B. Santos
DRAM Performance Sensor.
HCI (7)
(2022)
Cristian Díaz Martín
,
Eladio Durán Aranda
,
Salvador Pérez Litrán
,
Jorge Semião
Quasi-Resonant DC-DC Converter Single-Switch for Single-Input Bipolar-Output Applications.
IECON
(2022)
Jorge Semião
,
Luís Santos
,
Marcelino B. Santos
SRAM Performance Sensor.
DCIS
(2021)
Salvador P. Litran
,
Eladio Durán
,
María Bella Ferrera
,
Jorge Semião
,
Rafael S. Barroso
A Zeta-CSC Converter Combination for Single-Input and Bipolar Output.
IECON
(2019)
Jorge Semião
,
Ruben Cabral
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Performance Sensor for Reliable Operation.
HCI (8)
(2018)
Dario Cruz
,
Nelson Pinto
,
Jânio M. Monteiro
,
Pedro J. S. Cardoso
,
Cristiano Cabrita
,
Jorge Semião
,
Luís M. R. Oliveira
,
João M. F. Rodrigues
Development of an Energy Management System for the Charge Scheduling of Plug-in Electric Vehicles.
HCI (8)
(2018)
Carlos Leong
,
Jorge Semião
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Fault-Tolerance in Field Programmable Gate Array with Dynamic Voltage and Frequency Scaling.
J. Low Power Electron.
11 (4) (2015)
Pedro J. S. Cardoso
,
Gabriela Schütz
,
Jorge Semião
,
Jânio M. Monteiro
,
João M. F. Rodrigues
,
Andriy Mazayev
,
Emanuel Ey Vieira
,
Micael Viegas
,
Carlos Neves
,
Sérgio Anastácio
Integration of a Food Distribution Routing Optimization Software with an Enterprise Resource Planner.
GISTAM
(2015)
Carlos Leong
,
Jorge Semião
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Fault-tolerance in FPGA focusing power reduction or performance enhancement.
LATS
(2015)
Pedro J. S. Cardoso
,
Gabriela Schütz
,
Jorge Semião
,
Jânio M. Monteiro
,
João M. F. Rodrigues
,
Andriy Mazayev
,
Emanuel Ey
,
Micael Viegas
Integration of a Real-Time Stochastic Routing Optimization Software with an Enterprise Resource Planner.
GISTAM (Selected Papers)
(2015)
Jânio M. Monteiro
,
Jorge Eduardo
,
Pedro J. S. Cardoso
,
Jorge Semião
A distributed load scheduling mechanism for micro grids.
SmartGridComm
(2014)
Jorge Semião
,
David Saraiva
,
Carlos Leong
,
André Romão
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Performance sensor for tolerance and predictive detection of delay-faults.
DFT
(2014)
Carlos Leong
,
Jorge Semião
,
Isabel C. Teixeira
,
Marcelino B. Santos
,
João Paulo Teixeira
,
María Dolores Valdés
,
Judit Freijedo
,
Juan J. Rodríguez-Andina
,
Fabian Vargas
Aging monitoring with local sensors in FPGA-based designs.
FPL
(2013)
Julio César Vázquez
,
Víctor H. Champac
,
Jorge Semião
,
Isabel C. Teixeira
,
Marcelino B. Santos
,
João Paulo Teixeira
Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion.
J. Electron. Test.
29 (3) (2013)
Judit Freijedo
,
Jorge Semião
,
Juan J. Rodríguez-Andina
,
Fabian Vargas
,
Isabel C. Teixeira
,
João Paulo Teixeira
Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits.
J. Electron. Test.
28 (4) (2012)
Jackson Pachito
,
Celestino V. Martins
,
Bruno Jacinto
,
Jorge Semião
,
Julio César Vázquez
,
Víctor H. Champac
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Aging-Aware Power or Frequency Tuning With Predictive Fault Detection.
IEEE Des. Test Comput.
29 (5) (2012)
Jackson Pachito
,
Celestino V. Martins
,
Jorge Semião
,
Marcelino Bicho Dos Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
The influence of clock-gating on NBTI-induced delay degradation.
IOLTS
(2012)
R. S. Oliveira
,
Jorge Semião
,
Isabel C. Teixeira
,
Marcelino B. Santos
,
João Paulo Teixeira
On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications.
LATW
(2011)
R. S. Oliveira
,
Jorge Semião
,
Isabel C. Teixeira
,
Marcelino B. Santos
,
João Paulo Teixeira
On-Line BIST for Performance Failure Prediction Under NBTI-Induced Aging in Safety-Critical Applications.
J. Low Power Electron.
7 (4) (2011)
Vasco Bexiga
,
Carlos Leong
,
Jorge Semião
,
Isabel C. Teixeira
,
João Paulo Teixeira
,
María Dolores Valdés
,
Judit Freijedo
,
Juan J. Rodríguez-Andina
,
Fabian Vargas
Performance Failure Prediction Using Built-In Delay Sensors in FPGAs.
FPL
(2011)
Judit Freijedo
,
María Dolores Valdés
,
Lucía Costas
,
María José Moure
,
Juan J. Rodríguez-Andina
,
Jorge Semião
,
Fabian Vargas
,
Isabel C. Teixeira
,
João Paulo Teixeira
Operation of FPGA-Based Digital Circuits Through Delay Modeling and Time Borrowing.
J. Low Power Electron.
7 (2) (2011)
Judit Freijedo
,
Jorge Semião
,
Juan J. Rodríguez-Andina
,
Fabian Vargas
,
Isabel C. Teixeira
,
João Paulo Teixeira
Modeling the effect of process variations on the timing response of nanometer digital circuits.
LATW
(2011)
María Dolores Valdés
,
Judit Freijedo
,
María José Moure
,
Juan J. Rodríguez-Andina
,
Jorge Semião
,
Fabian Vargas
,
Isabel C. Teixeira
,
João Paulo Teixeira
Programmable sensor for on-line checking of signal integrity in FPGA-based systems subject to aging effects.
LATW
(2011)
Celestino V. Martins
,
Jorge Semião
,
Julio César Vázquez
,
Víctor H. Champac
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors.
VTS
(2011)
Raul Chipana
,
Letícia Maria Veiras Bolzani
,
Fabian Vargas
,
Jorge Semião
,
Juan J. Rodríguez-Andina
,
Isabel C. Teixeira
,
João Paulo Teixeira
Investigating the Use of BICS to detect resistive-open defects in SRAMs.
IOLTS
(2010)
Judit Freijedo
,
Lucía Costas
,
Jorge Semião
,
Juan J. Rodríguez-Andina
,
María José Moure
,
Fabian Vargas
,
Isabel C. Teixeira
,
João Paulo Teixeira
Impact of Power Supply Voltage Variations on FPGA-Based Digital Systems Performance.
J. Low Power Electron.
6 (2) (2010)
Julio César Vázquez
,
Víctor H. Champac
,
Adriel Ziesemer
,
Ricardo Reis
,
Jorge Semião
,
Isabel C. Teixeira
,
Marcelino B. Santos
,
João Paulo Teixeira
Predictive error detection by on-line aging monitoring.
IOLTS
(2010)
Jorge Semião
,
Judit Freijedo
,
Marlon Moraes
,
M. Mallmann
,
C. Antunes
,
Juliano Benfica
,
Fabian Vargas
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
Juan J. Rodríguez-Andina
,
João Paulo Teixeira
,
D. Lupi
,
Edmundo Gatti
,
L. Garcia
,
Fernando Hernandez
Measuring clock-signal modulation efficiency for Systems-on-Chip in electromagnetic interference environment.
LATW
(2009)
Jorge Semião
,
Judit Freijedo
,
Juan J. Rodríguez-Andina
,
Fabian Vargas
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies.
IOLTS
(2009)
Judit Freijedo
,
Jorge Semião
,
Juan J. Rodríguez-Andina
,
Fabian Vargas
,
Isabel C. Teixeira
,
João Paulo Teixeira
Delay Modeling for Power Noise and Temperature-Aware Design and Test of Digital Systems.
J. Low Power Electron.
4 (3) (2008)
Jorge Semião
,
Juan J. Rodríguez-Andina
,
Fabian Vargas
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits.
DDECS
(2008)
Jorge Semião
,
Marcial Jesús Rodríguez-Irago
,
Juan J. Rodríguez-Andina
,
Leonardo Bisch Piccoli
,
Fabian Vargas
,
Marcelino Bicho Dos Santos
,
Isabel Maria Cacho Teixeira
,
João Paulo Teixeira
Signal Integrity Enhancement in Digital Circuits.
IEEE Des. Test Comput.
25 (5) (2008)
Jorge Semião
,
João Varela
,
Judit Freijedo
,
Juan J. Rodríguez-Andina
,
Carlos Leong
,
João Paulo Teixeira
,
Isabel C. Teixeira
Robust solution for synchronous communication among multi clock domains.
APCCAS
(2008)
Jorge Semião
,
Judit Freijedo
,
Juan J. Rodríguez-Andina
,
Fabian Vargas
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits.
IOLTS
(2008)
Jorge Semião
,
Judit Freijedo
,
Juan J. Rodríguez-Andina
,
Fabian Vargas
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Time Management for Low-Power Design of Digital Systems.
J. Low Power Electron.
4 (3) (2008)
Jorge Semião
,
Juan J. Rodríguez-Andina
,
Fabian Vargas
,
Marcelino Bicho Dos Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations.
DFT
(2007)
Jorge Semião
,
Judit Freijedo
,
Juan J. Rodríguez-Andina
,
Fabian Vargas
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits.
IOLTS
(2007)
Jorge Semião
,
Judit Freijedo
,
Juan J. Rodríguez-Andina
,
Fabian Vargas
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits.
DDECS
(2007)
Jorge Semião
,
Judit Freijedo
,
Juan J. Rodríguez-Andina
,
Fabian Vargas
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Enhancing the Tolerance to Power-Supply Instability in Digital Circuits.
ISVLSI
(2007)
Marcial Jesús Rodríguez-Irago
,
Juan J. Rodríguez-Andina
,
Fabian Vargas
,
Jorge Semião
,
Isabel C. Teixeira
,
João Paulo Teixeira
Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes.
IOLTS
(2006)
F. Guerreiro
,
Jorge Semião
,
A. Pierce
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Functional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage.
DDECS
(2006)
Yervant Zorian
,
Paolo Prinetto
,
João Paulo Teixeira
,
Isabel C. Teixeira
,
Carlos Eduardo Pereira
,
Octávio Páscoa Dias
,
Jorge Semião
,
Peter Muhmenthaler
,
W. Radermacher
Embedded tutorial: TRP: integrating embedded test and ATE.
DATE
(2001)
Octávio Páscoa Dias
,
Jorge Semião
,
Marcelino B. Santos
,
Isabel C. Teixeira
,
João Paulo Teixeira
Quality of Electronic Design: From Architectural Level to Test Coverage.
ISQED
(2000)
Octávio Páscoa Dias
,
Jorge Semião
,
Marcelino B. Santos
,
Isabel Maria Cacho Teixeira
,
João Paulo Teixeira
From system level to defect-oriented test: a case study.
ETW
(1999)