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Functional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage.
F. Guerreiro
Jorge Semião
A. Pierce
Marcelino B. Santos
Isabel C. Teixeira
João Paulo Teixeira
Published in:
DDECS (2006)
Keyphrases
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built in self test
dynamic environments
high speed
integrated circuit
data sets
machine learning
genetic algorithm
image processing
artificial neural networks
wavelet transform
fuzzy logic
fault diagnosis
fault detection and isolation