Marcelino B. Santos

Publication Activity (10 Years)

Years Active: 1992-2023
Publications (10 Years): 10

Top Topics

Failure Detection

Power Management

Field Programmable Gate Array

Ultra Low Power

Top Venues

Microelectron. J.

Publications

Carlos Santos, Jorge R. Fernandes, Marcelino B. Santos, Ricardo Martins
Paving the Way for the Electronic Design Automation of Power Management Units. SMACD (2023)
Jorge Semião, Luís Santos, Marcelino B. Santos
DRAM Performance Sensor. HCI (7) (2022)
Carlos Santos, Jorge R. Fernandes, Marcelino B. Santos
Load Optimized Gate Driving for Charge Pumps. DCIS (2022)
Jorge Semião, Luís Santos, Marcelino B. Santos
SRAM Performance Sensor. DCIS (2021)
José M. Leitão, Ricardo Chaves, Marcelino B. Santos
Applying Model Checking in the Verification of a Clock Masking Unit. DCIS (2019)
Jorge Semião, Ruben Cabral, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Performance Sensor for Reliable Operation. HCI (8) (2018)
Rodrigo B. Capeleiro, Marcelino B. Santos
Low noise, high efficiency, segmented LCD drivers for ultra-low power applications in 22 nm FD-SOI. DCIS (2018)
Rodrigo B. Capeleiro, José M. Leitão, Ricardo Chaves, Marcelino B. Santos
Low-power frequency monitoring circuit for clock failure detection. DCIS (2018)
Carlos Leong, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Fault-Tolerance in Field Programmable Gate Array with Dynamic Voltage and Frequency Scaling. J. Low Power Electron. 11 (4) (2015)
Carlos Leong, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Fault-tolerance in FPGA focusing power reduction or performance enhancement. LATS (2015)
Abilio Parreira, Floriberto A. Lima, Marcelino B. Santos
Digital modular control of high frequency DC-DC converters. Microelectron. J. 45 (10) (2014)
Carlos Moreira, Marcelino B. Santos
Implicit current DC-DC Digital Voltage-Mode Control. ISIE (2014)
Jorge Semião, David Saraiva, Carlos Leong, André Romão, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Performance sensor for tolerance and predictive detection of delay-faults. DFT (2014)
Carlos Leong, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira, María Dolores Valdés, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas
Aging monitoring with local sensors in FPGA-based designs. FPL (2013)
Jorge O. M. Esteves, João Pereira, Júlio Paisana, Marcelino B. Santos
Ultra low power capless LDO with dynamic biasing of derivative feedback. Microelectron. J. 44 (2) (2013)
Julio César Vázquez, Víctor H. Champac, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion. J. Electron. Test. 29 (3) (2013)
Valter Sádio, Fabian Rein, Christian Münker, Marcelino B. Santos
Modeling of Inherent Losses of Fully Integrated Switched Capacitor DC-DC Converters. J. Low Power Electron. 8 (5) (2012)
Tiago Costa, Moisés Simões Piedade, Marcelino B. Santos
An ultra-low noise current source for magnetoresistive biosensors biasing. BioCAS (2012)
Jackson Pachito, Celestino V. Martins, Bruno Jacinto, Jorge Semião, Julio César Vázquez, Víctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Aging-Aware Power or Frequency Tuning With Predictive Fault Detection. IEEE Des. Test Comput. 29 (5) (2012)
R. S. Oliveira, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications. LATW (2011)
R. S. Oliveira, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
On-Line BIST for Performance Failure Prediction Under NBTI-Induced Aging in Safety-Critical Applications. J. Low Power Electron. 7 (4) (2011)
Carlos O. Moreira, J. Fernando A. da Silva, Sónia Ferreira Pinto, Marcelino B. Santos
Digital LQR control with Kalman Estimator for DC-DC Buck converter. EUROCON (2011)
Bruno Jacinto, Carlos Moreira, Marcelino B. Santos
Digital Sliding Mode Control of DC-DC Buck Converters. J. Low Power Electron. 7 (2) (2011)
Jorge O. M. Esteves, Tiago H. Moita, Carlos B. Almeida, Marcelino B. Santos
ICT: Interface software for the characterization and test of mixed-signal power cores. IOLTS (2011)
Nuno Guerreiro, Marcelino B. Santos
Mixed-Signal Fault Equivalence: Search and Evaluation. Asian Test Symposium (2011)
Celestino V. Martins, Jorge Semião, Julio César Vázquez, Víctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors. VTS (2011)
Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
Predictive error detection by on-line aging monitoring. IOLTS (2010)
Julio César Vázquez, Víctor H. Champac, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
Programmable aging sensor for automotive safety-critical applications. DATE (2010)
Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel Maria Cacho Teixeira, Marcelino B. Santos, João Paulo Teixeira
Low-sensitivity to process variations aging sensor for automotive safety-critical applications. VTS (2010)
Nuno Dias, Marcelino B. Santos, Angelo Monteiro, Pedro Braga, Alexandre Neves
Gate Driver Voltage Optimization for Multi-Mode Low Power DC-DC Conversion. J. Low Power Electron. 5 (2) (2009)
Jorge Semião, Judit Freijedo, Marlon Moraes, M. Mallmann, C. Antunes, Juliano Benfica, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Juan J. Rodríguez-Andina, João Paulo Teixeira, D. Lupi, Edmundo Gatti, L. Garcia, Fernando Hernandez
Measuring clock-signal modulation efficiency for Systems-on-Chip in electromagnetic interference environment. LATW (2009)
Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
Built-in aging monitoring for safety-critical applications. IOLTS (2009)
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies. IOLTS (2009)
Angelo Monteiro, Marcelino B. Santos, Alexandre Neves, Nuno Dias
Noise Minimization for Low Power Bandgap Reference and Low Dropout Regulator Cores. J. Low Power Electron. 5 (2) (2009)
José F. da Rocha, Nuno Dias, Angelo Monteiro, Alexandre Neves, Gabriel Santos, Marcelino B. Santos, João Paulo Teixeira
Controllability and observability in mixed signal cores. IOLTS (2009)
Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits. DDECS (2008)
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits. IOLTS (2008)
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Time Management for Low-Power Design of Digital Systems. J. Low Power Electron. 4 (3) (2008)
Rodrigo Duarte, Júlio Paisana, Marcelino B. Santos, Floriberto A. Lima
Adjustable low consumption circuit for monitorization of power source voltages in a SoC. APCCAS (2008)
Nuno Dias, Marcelino B. Santos, Floriberto A. Lima, Beatriz Borges, Júlio Paisana
Monolithic Multi-mode DC-DC Converter with Gate Voltage Optimization. PATMOS (2008)
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits. IOLTS (2007)
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits. DDECS (2007)
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Enhancing the Tolerance to Power-Supply Instability in Digital Circuits. ISVLSI (2007)
Marcelino B. Santos, João Paulo Teixeira
Functional-oriented mask-based built-in self-test. IET Comput. Digit. Tech. 1 (5) (2007)
F. Guerreiro, Jorge Semião, A. Pierce, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Functional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage. DDECS (2006)
Abilio Parreira, Marcelino B. Santos, João Paulo Teixeira
BIST Architectures and Fault Emulation. LATW (2006)
José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João Paulo Cacho Teixeira
DFT and Probabilistic Testability Analysis at RTL. HLDVT (2006)
José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João Paulo Teixeira
Probabilistic Testability Analysis and DFT Methods at RTL. DDECS (2006)
D. Barros Júnior, Marcial Jesús Rodríguez-Irago, Marcelino B. Santos, Isabel C. Teixeira, Fabian Vargas, João Paulo Teixeira
Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip. J. Electron. Test. 21 (4) (2005)
Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test. IOLTS (2005)
Daniel Barros Jr., Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Modeling and Simulation of Time Domain Faults in Digital Systems. IOLTS (2004)
Abilio Parreira, João Paulo Teixeira, Marcelino B. Santos
Built-In Self-Test Quality Assessment Using Hardware Fault Emulation In FPGAs. Comput. Artif. Intell. 23 (5) (2004)
Abilio Parreira, João Paulo Teixeira, Marcelino B. Santos
FPGAs BIST Evaluation. FPL (2004)
José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João Paulo Teixeira
A Probabilistic Method for the Computation of Testability of RTL Constructs. DATE (2004)
Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Luz Balado, Joan Figueras
On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. J. Electron. Test. 20 (4) (2004)
Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Property Coverage for Quality Assessment of Fault Tolerant or Fail Safe Systems. IOLTS (2003)
Abilio Parreira, João Paulo Teixeira, A. Pantelimon, Marcelino B. Santos, José T. de Sousa
Fault Simulation Using Partially Reconfigurable Hardware. FPL (2003)
Marcelino B. Santos, José M. Fernandes, Isabel C. Teixeira, João Paulo Teixeira
RTL Test Pattern Generation for High Quality Loosely Deterministic BIST. DATE (2003)
Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Self-Checking and Fault Tolerance Quality Assessment Using Fault Sampling. DFT (2002)
Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Rosa Rodríguez-Montañés, Joan Figueras
RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. ITC (2002)
Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Luz Balado, Joan Figueras
On High-Quality, Low Energy BIST Preparation at RT-Level. LATW (2002)
Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira
RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage. J. Electron. Test. 18 (2) (2002)
Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Design and Test of a Certifiable ASIC for a Safety-Critical Gas Burner Control System. J. Electron. Test. 18 (3) (2002)
Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-level. ITC (2001)
Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira
RTL design validation, DFT and test pattern generation for high defects coverage. ETW (2001)
Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira
RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems. J. Electron. Test. 17 (3-4) (2001)
Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Design and Test of Certifiable ASICs for Safety-Critical Gas Burners Contro. IOLTW (2001)
Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira
RTL-based functional test generation for high defects coverage in digital SOCs. ETW (2000)
Marcelino B. Santos, João Paulo Teixeira
Experiments on RTL ATPG and Fault Simulation for High Defect Coverage in Digital Systems-on-a-Chip. LATW (2000)
Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Quality of Electronic Design: From Architectural Level to Test Coverage. ISQED (2000)
Salvador Manich, A. Gabarró, M. Lopez, Joan Figueras, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, João Paulo Teixeira, Marcelino B. Santos
Low Power BIST by Filtering Non-Detecting Vectors. J. Electron. Test. 16 (3) (2000)
Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Joan Figueras, Salvador Manich, João Paulo Teixeira, Marcelino B. Santos
Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity. ISCAS (1) (1999)
Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira
From system level to defect-oriented test: a case study. ETW (1999)
Marcelino B. Santos, João Paulo Teixeira
Defect-Oriented Mixed-Level Fault Simulation of Digital Systems-on-a-Chip Using HDL. DATE (1999)
Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira
Defect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified Fault Sampling Technique. VTS (1999)
Salvador Manich, A. Gabarró, M. Lopez, Joan Figueras, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, P. Teixeira, Marcelino B. Santos
Low power BIST by filtering non-detecting vectors. ETW (1999)
Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Defect-oriented test quality assessment using fault sampling and simulation. ITC (1998)
Marcelino B. Santos, Fernando M. Gonçalves, Michael J. Ohletz, João Paulo Teixeira
Defect-oriented testing of analogue and mixed signal ICs. ICECS (1998)
João Paulo Teixeira, F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos
VHDL fault simulation for defect-oriented test and diagnosis of digital ICs. EURO-DAC (1996)
F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos, João Paulo Teixeira
Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation. ITC (1996)
Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira
Test preparation methodology for high coverage of physical defects in CMOS digital ICs. ED&TC (1995)
Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira
Test preparation for high coverage of physical defects in CMOS digital ICs. VTS (1995)
A. P. Casimiro, Fernando M. Gonçalves, João Paulo Teixeira, Marcelino B. Santos
On the Analysis of Routing Cells and Adjacency Faults in CMOS Digital Circuits. DFT (1994)
Mario Calha, Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira
Back Annotation of Physical Defects into Gate-Level, Realistic Faults in Digital ICs. ITC (1994)
P. Nicolau, J. Barbosa, M. Saraiva, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Realistic Fault Analysis of CMOS Analog Building Blocks. DFT (1993)
A. P. Casimiro, M. Simões, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Experiments on Bridging Fault Analysis and Layout-Level DFT for CMOS Designs. DFT (1993)
M. Saraiva, P. Casimiro, Marcelino B. Santos, José T. de Sousa, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira
Physical DFT for High Coverage of Realistic Faults. ITC (1992)
M. Saraiva, Marcelino B. Santos, A. P. Casimiro, Isabel Maria Cacho Teixeira, João Paulo Teixeira
On the design of a highly testable cell library. Microprocess. Microprogramming 35 (1-5) (1992)