Test preparation for high coverage of physical defects in CMOS digital ICs.

Marcelino B. Santos M. Simões Isabel C. Teixeira João Paulo Teixeira

Published in: VTS (1995)

Keyphrases

circuit design
test suite
wide range
cmos image sensor
low cost
neural network
set of test cases
test data
physical world
information technology
high speed
high precision
power consumption
genetic algorithm
real world
data sets
statistical tests
metadata
digital media
defect detection
mixed signal