Probabilistic Testability Analysis and DFT Methods at RTL.
José M. FernandesMarcelino B. SantosArlindo L. OliveiraJoão Paulo TeixeiraPublished in: DDECS (2006)
Keyphrases
- significant improvement
- computational cost
- machine learning
- benchmark datasets
- empirical studies
- methods require
- data mining
- complexity analysis
- quantitative analysis
- computationally expensive
- data mining techniques
- probability distribution
- probabilistic model
- image analysis
- artificial neural networks
- high dimensional
- association rules
- learning algorithm