METHODS REQUIRE
Experts
- Vladik Kreinovich
- Martin J. Gander
- Miodrag S. Petkovic
- Peter Richtárik
- Zdzislaw Jackiewicz
- Jesse Chan
- Susanne C. Brenner
- Bernardo Cockburn
- Carsten Carstensen
- Gang Chen
- Shuhuang Xiang
- Alicia Cordero
- Eric T. Chung
- Yurii E. Nesterov
- Li-Yeng Sung
- Kevin Burrage
- Timothy Warburton
- Paola F. Antonietti
- Mikko T. Siponen
- Juan R. Torregrosa
- Xiaofei Zhao
- Xinyuan Wu
- Jesús Vigo-Aguiar
- Carlos Hernández-Espinosa
- Olga E. Baklanova
- Ramani Duraiswami
- Masud Fazal-Baqaie
- Andrew W. Palmer
- Xianyang Zeng
- Janet C. Read
- Marvin Grieger
- Mercedes Fernández-Redondo
- Yinhua Xia
- Stefan Engblom
- Nail A. Gumerov
- Eric Moulines
- Jintao Cui
- Tandy J. Warnow
- Jan S. Hesthaven
Venues
- CoRR
- J. Comput. Phys.
- Appl. Math. Comput.
- SIAM J. Sci. Comput.
- Sensors
- IEEE Access
- Numer. Algorithms
- SIAM J. Numer. Anal.
- Int. J. Uncertain. Fuzziness Knowl. Based Syst.
- J. Sci. Comput.
- J. Comput. Appl. Math.
- ICASSP
- Remote. Sens.
- Comput. Math. Appl.
- Math. Program.
- Comput. Phys. Commun.
- J. Comput. Chem.
- Int. J. Comput. Math.
- Symmetry
- Eur. J. Oper. Res.
- Computing
- Math. Comput.
- SIAM Rev.
- CHI
- Appl. Math. Lett.
- Numerische Mathematik
- IEEE Trans. Instrum. Meas.
- Bioinform.
- Scientometrics
- IGARSS
- ACM Trans. Math. Softw.
- IEEE Trans. Signal Process.
- J. Oper. Res. Soc.
- J. Chem. Inf. Model.
- IEEE Trans. Pattern Anal. Mach. Intell.
- NeuroImage
- CHI Extended Abstracts
- Expert Syst. Appl.
- Microelectron. Reliab.
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