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On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level.
Marcelino B. Santos
Isabel C. Teixeira
João Paulo Teixeira
Salvador Manich
Luz Balado
Joan Figueras
Published in:
J. Electron. Test. (2004)
Keyphrases
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low energy
high quality
coarse grained
electron microscopy
minimum energy
fine grained
protein folding
real time
data sets
neural network
high speed
data collection
x ray