Luz Balado

Publication Activity (10 Years)

Years Active: 2002-2020
Publications (10 Years): 4

Top Topics

Interarrival And Service Times

Kolmogorov Smirnov

Top Venues

J. Electron. Test.

IET Circuits Devices Syst.

Publications

Álvaro Gómez-Pau, Emili Lupon, Luz Balado, Joan Figueras
Indirect and adaptive test of analogue circuits based on preselected steady-state response measures. IET Circuits Devices Syst. 14 (5) (2020)
Álvaro Gómez-Pau, Luz Balado, Joan Figueras
Multi-Directional Space Tessellation to Improve the Decision Boundary in Indirect Mixed-Signal Testing. J. Electron. Test. 33 (3) (2017)
Álvaro Gómez-Pau, Luz Balado, Joan Figueras
Indirect test of M-S circuits using multiple specification band guarding. Integr. 55 (2016)
Álvaro Gómez-Pau, Luz Balado, Joan Figueras
Efficient Production Binning Using Octree Tessellation in the Alternate Measurements Space. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35 (8) (2016)
Álvaro Gómez-Pau, Luz Balado, Joan Figueras
Analog circuits testing using digitally coded indirect measurements. DTIS (2015)
Álvaro Gómez-Pau, Luz Balado, Joan Figueras
M-S specification binning based on digitally coded indirect measurements. ETS (2014)
Álvaro Gómez-Pau, Luz Balado, Joan Figueras
M-S test based on specification validation using octrees in the measure space. ETS (2013)
Alvaro Gómez, Ricard Sanahuja, Luz Balado, Joan Figueras
Analog circuit test based on a digital signature. DATE (2010)
Luz Balado, Emili Lupon, Joan Figueras, Miquel Roca, Eugeni Isern, Rodrigo Picos
Verifying Functional Specifications by Regression Techniques on Lissajous Test Signatures. IEEE Trans. Circuits Syst. I Regul. Pap. (4) (2009)
Luz Balado, Emili Lupon, L. García, Rosa Rodríguez-Montañés, Joan Figueras
Lissajous Based Mixed-Signal Testing for N-Observable Signals. DDECS (2006)
R. Sanahuja, Victor Barcons, Luz Balado, Joan Figueras
Testing Biquad Filters under Parametric Shifts Using X-Y Zoning. J. Electron. Test. 21 (3) (2005)
Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. J. Electron. Test. 20 (2) (2004)
Marie-Lise Flottes, Yves Bertrand, Luz Balado, Emili Lupon, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, Nicoleta Pricopi, Hans-Joachim Wunderlich
Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ. DELTA (2004)
Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Luz Balado, Joan Figueras
On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. J. Electron. Test. 20 (4) (2004)
Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras
BIST Technique by Equally Spaced Test Vector Sequences. VTS (2004)
Yves Bertrand, Marie-Lise Flottes, Luz Balado, Joan Figueras, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, Nicoleta Pricopi, Hans-Joachim Wunderlich, Jean-Pierre Van der Heyden
Test Engineering Education in Europe: the EuNICE-Test Project. MSE (2003)
Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, R. Rodriguez, Joan Figueras
On the selection of efficient arithmetic additive test pattern generators [logic test]. ETW (2003)
Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. IOLTW (2002)
Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Luz Balado, Joan Figueras
On High-Quality, Low Energy BIST Preparation at RT-Level. LATW (2002)