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Analog circuits testing using digitally coded indirect measurements.

Álvaro Gómez-PauLuz BaladoJoan Figueras
Published in: DTIS (2015)
Keyphrases
  • analog circuits
  • fault diagnosis
  • digital circuits
  • neural network
  • wavelet packet transform
  • computer vision
  • test cases
  • data mining
  • machine learning
  • image processing
  • software testing
  • measured data
  • measurement noise