ERROR MEASURE
Experts
- Dror Baron
- Enrico Vicario
- Laura Carnevali
- Jin Tan
- Dan Geer
- Sankar K. Pal
- Mohammad Abdollahi Azgomi
- Rolf Drechsler
- Alexander A. Alemi
- Wiro J. Niessen
- Alec Jacobson
- Alexandru C. Telea
- Ronald R. Yager
- Ian Fischer
- Marco Biagi
- Danielle Carmon
- Minos N. Garofalakis
- Amos Lapidoth
- Shinji Kakei
- Gary White
- Yuming Jin
- Hossein Pedram
- Ismael González Yero
- Zhicheng Yang
- Kensaku Mori
- Fabio Tarani
- Felicita Di Giandomenico
- Tarik A. Rashid
- Giulia Bernardini
- Mohsen Machhout
- Luca Palmerini
- Max A. Viergever
- Adriel Saporta
- David A. Rottenberg
- Alessandro Tognetti
- Prasant Mohapatra
- Jun-ichiro Toriwaki
- Belgacem Bouallegue
- Jianyu Wang
Venues
- CoRR
- Sensors
- EMBC
- IEEE Access
- QEST
- IEEE Trans. Inf. Theory
- NeuroImage
- ICASSP
- Pattern Recognit.
- DATE
- Remote. Sens.
- IEEE Trans. Instrum. Meas.
- J. Robotics Mechatronics
- IEEE Trans. Software Eng.
- IEEE Trans. Commun.
- J. Digit. Imaging
- Scientometrics
- ISIT
- IEEE Trans. Signal Process.
- ISBI
- ISSRE
- IEEE Trans. Biomed. Eng.
- Reliab. Eng. Syst. Saf.
- SIAM J. Sci. Comput.
- SIAM J. Numer. Anal.
- Numer. Algorithms
- CIARP
- Inf. Sci.
- IEEE Trans. Image Process.
- J. Comput. Phys.
- IROS
- login Usenix Mag.
- ITC
- Appl. Math. Comput.
- J. Electronic Imaging
- Exp. Math.
- ISCAS
- VLDB J.
- WSC
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