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On the selection of efficient arithmetic additive test pattern generators [logic test].

Salvador ManichL. GarcíaLuz BaladoEmili LuponJosep RiusR. RodriguezJoan Figueras
Published in: ETW (2003)
Keyphrases
  • information systems
  • logic programming
  • databases
  • machine learning
  • cost effective
  • computationally expensive
  • data generator