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From system level to defect-oriented test: a case study.

Octávio Páscoa DiasJorge SemiãoMarcelino B. SantosIsabel Maria Cacho TeixeiraJoão Paulo Teixeira
Published in: ETW (1999)
Keyphrases
  • databases
  • higher level
  • real time
  • genetic algorithm
  • probabilistic model
  • test cases
  • test data