Daniel Barros Jr.

Publication Activity (10 Years)

Years Active: 1998-2004
Publications (10 Years): 0

Publications

Daniel Barros Jr., Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
Modeling and Simulation of Time Domain Faults in Digital Systems. IOLTS (2004)
Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr., Diogo B. Brum, Eduardo Luis Rhod
Merging a DSP-Oriented Signal Integrity Technique and SW-Based Fault Handling Mechanisms to Ensure Reliable DSP Systems. J. Electron. Test. 20 (4) (2004)
Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.
A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems. J. Electron. Test. 19 (1) (2003)
Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr., Diogo B. Brum
Briefing a New Approach to Improve the EMI Immunity of DSP Systems. Asian Test Symposium (2003)
Fabian Vargas, Rubem D. R. Fagundes, Daniel Barros Jr.
A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems. LATW (2002)
Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.
Experimental Results of a Recovery Block Scheme to Handle Noise in Speech Recognition Systems. Asian Test Symposium (2002)
Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.
A New On-Line Robust Approach to Design Noise Immune Speech Recognition Systems. IOLTW (2002)
Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.
Summarizing a New Approach to Design Speech Recognition Systems: A Reliable Noise-Immune HW-SW Version. SBCCI (2001)
Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.
Orienting Redundancy and HW/SW Codesign Techniques Towards Speech Recognition Systems. LATW (2001)
Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.
A New Approach to Design Reliable Real-Time Speech Recognition Systems. IOLTW (2001)
Fabian Vargas, Eduardo Bezerra, A. Terroso, Daniel Barros Jr.
Reliability Verification of Fault-Tolerant Systems Design based on Mutation Analysis. SBCCI (1998)
Fabian Vargas, Eduardo A. Bezerra, L. Wulff, Daniel Barros Jr.
Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems. Asian Test Symposium (1998)