Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation.
F. CeleiroL. DiasJ. FerreiraMarcelino B. SantosJoão Paulo TeixeiraPublished in: ITC (1996)
Keyphrases
- fault diagnosis
- fault detection
- multiple faults
- integrated circuit
- model based diagnosis
- diagnostic tests
- simulation model
- fault model
- discrete event
- fuzzy logic
- data sets
- simulation models
- statistical tests
- test cases
- fault detection and isolation
- normal operation
- fault models
- matlab simulation
- fault detection and diagnosis
- failure modes
- diagnostic reasoning
- simulation environment
- machine vision
- test data
- mathematical model
- control system
- neural network