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Test preparation methodology for high coverage of physical defects in CMOS digital ICs.
Marcelino B. Santos
M. Simões
Isabel C. Teixeira
João Paulo Teixeira
Published in:
ED&TC (1995)
Keyphrases
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circuit design
test suite
low cost
set of test cases
power consumption
high speed
vlsi circuits
high precision
low power
statistical tests
test data
mixed signal
test cases
cmos image sensor
digital curves
test generation
defect detection
analog vlsi
statistically significant