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RTL Test Pattern Generation for High Quality Loosely Deterministic BIST.
Marcelino B. Santos
José M. Fernandes
Isabel C. Teixeira
João Paulo Teixeira
Published in:
DATE (2003)
Keyphrases
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high quality
ground truth
high resolution
black box
image quality
higher quality
model based diagnosis
randomized algorithms
stochastic methods
neural network
real world
data mining
computer vision
decision making
decision trees
image data