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Reliability Analysis of H-Tree Random Access Memories Implemented With Built in Current Sensors and Parity Codes for Multiple Bit Upset Correction.

Costas ArgyridesRaul ChipanaFabian VargasDhiraj K. Pradhan
Published in: IEEE Trans. Reliab. (2011)
Keyphrases
  • random access
  • reliability analysis
  • error correction
  • error correcting codes
  • multiview video coding
  • disk storage
  • tree structure
  • neural network
  • fuzzy logic
  • image coding
  • optimization model
  • error detection
  • memory size