G. Cardoso Medeiros

Publication Activity (10 Years)

Years Active: 2015-2021
Publications (10 Years): 8

Top Topics

Integrated Circuit

Temporal Behavior

Significantly Reduced

Defect Detection

Top Venues

J. Electron. Test.

Publications

G. Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. ETS (2021)
G. Cardoso Medeiros, Moritz Fieback, Thiago Santos Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia B. Poehls, Said Hamdioui
Improving the Detection of Undefined State Faults in FinFET SRAMs. DTIS (2021)
G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects. J. Electron. Test. 35 (2) (2019)
G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs. LATS (2018)
G. Cardoso Medeiros, Letícia Maria Veiras Bolzani, Mottaqiallah Taouil, Fabian Vargas, Said Hamdioui
A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs. Microelectron. Reliab. (2018)
M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Marcus Pohls
Analysing NBTI Impact on SRAMs with Resistive Defects. J. Electron. Test. 33 (5) (2017)
G. Cardoso Medeiros, Letícia Maria Bolzani Pöhls, Fabian Vargas
Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects. VLSI Design (2016)
M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Poehls
Analyzing NBTI impact on SRAMs with resistive-open defects. LATS (2016)
Thiago Copetti, G. Cardoso Medeiros, Letícia Maria Bolzani Poehls, Fabian Vargas
NBTI-aware design of integrated circuits: a hardware-based approach. LATS (2015)