Tiago R. Balen

Publication Activity (10 Years)

Years Active: 2004-2024
Publications (10 Years): 29

Top Topics

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Analog Circuits

Comparative Study

Top Venues

J. Electron. Test.

Publications

Clayton R. Farias, Tiago R. Balen, Paulo F. Butzen
Cross-Section Estimation for Assessment of Circuit Susceptibility to Radiation. LATS (2024)
Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago R. Balen
Behavioral and Variability Analysis of Enclosed Layout Transistors for Radiation Hardened Analog Circuits. LATS (2024)
Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr., Rafael Iankowski Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen
Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems. J. Electron. Test. 39 (4) (2023)
Állan G. Ferreira, Lucas B. Zilch, Vinícius Navarro, Marcelo Soares Lubaszewski, Tiago R. Balen
Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits. SBCCI (2023)
Rodrigo N. Wuerdig, Bruno Canal, Tiago R. Balen, Sergio Bampi
Designing a 9.3μW Low-Power Time-to-Digital Converter (TDC) for a Time Assisted SAR ADC. SBCCI (2022)
Bruno Canal, Hamilton Klimach, Sergio Bampi, Tiago R. Balen
Hybrid Comparator and Window Switching Scheme for low-power SAR ADC. LASCAS (2022)
Bruno Canal, Hamilton Duarte Klimach, Sergio Bampi, Tiago R. Balen
Time Assisted SAR ADC with Bit-guess and Digital Error Correction. SBCCI (2022)
Clayton R. Farias, Rafael B. Schvittz, Tiago R. Balen, Paulo F. Butzen
Evaluating Soft Error Reliability of Combinational Circuits Using a Monte Carlo Based Method. LATS (2022)
Lucas B. Zilch, Állan G. Ferreira, Marcelo Soares Lubaszewski, Tiago R. Balen
Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool. LATS (2022)
Tiago R. Balen, Carlos J. Gonzalez, Ingrid F. V. Oliveira, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. de Aguiar, Marcilei A. Guazzelli, Nilberto H. Medina, Paulo F. Butzen
Reliability Evaluation of Voters for Fault Tolerant Approximate Systems. LATS (2021)
Thiago Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls
Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects. J. Electron. Test. 36 (2) (2020)
Leonardo Bisch Piccoli, Renato V. B. Henriques, Tiago R. Balen
Design of an Integrated System for On-line Test and Diagnosis of Rotary Actuators. J. Electron. Test. 36 (4) (2020)
Gustavo P. Platcheck, Guilherme S. Cardoso, Tiago R. Balen
Characterization of Enclosed Layout Transistors for Analog Applications on a130nm Technology. SBCCI (2020)
Bruno Canal, Hamilton Duarte Klimach, Sergio Bampi, Tiago R. Balen
Low-Voltage Dynamic Comparator with Bulk-Driven Floating Inverter Amplifier. SBCCI (2020)
Bruno L. Costa, Carlos J. Gonzalez, Rafael Galhardo Vaz, Odair Lelis Gonçalez, Tiago R. Balen
Influence of sampling frequency on TID response of SAR ADCs. LATS (2020)
Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen
Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. LATS (2020)
G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects. J. Electron. Test. 35 (2) (2019)
Thiago Santos Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls
A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects. LATS (2019)
Luiz G. S. Dias, Carlos J. Gonzalez, Fernando J. Boeira, Tiago R. Balen
Electromagnetic Immunity Test of Analog-to-Digital Interfaces of a Mixed-Signal Programmable SoC. LATS (2019)
G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs. LATS (2018)
Carlos J. Gonzalez, Cristiano P. Chenet, Matheus Budelon, Rafael Galhardo Vaz, Odair Lelis Goncalez, Tiago R. Balen
Evaluation of a mixed-signal design diversity system under radiation effects. LATS (2017)
André Lucas Chinazzo, Paulo César Comassetto de Aguirre, Tiago R. Balen
Low cost automatic test vector generation for structural analog testing. LATS (2017)
Thales E. Becker, Alisson J. C. Lanot, Guilherme S. Cardoso, Tiago R. Balen
Single event transient effects on charge redistribution SAR ADCs. Microelectron. Reliab. 73 (2017)
Thiago Santos Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Tiago R. Balen
Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs. VLSI-SoC (Selected Papers) (2017)
Thiago Santos Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls
Analyzing the behavior of FinFET SRAMs with resistive defects. VLSI-SoC (2017)
Daniel Fusco, Tiago R. Balen
Radiation Effects in Low Power and Ultra-Low Power Voltage References. J. Low Power Electron. 12 (4) (2016)
Guilherme S. Cardoso, Tiago R. Balen
Performance evaluation of radiation hardened analog circuits based on Enclosed Layout geometry. LATS (2016)
Guilherme S. Cardoso, Tiago R. Balen
Study of layout extraction accuracy on W/L estimation of ELT in analog design flow. LASCAS (2016)
Daniel Fusco, Tiago R. Balen
Radiation effects in low power and ultra low power voltage references. LATS (2016)
Isis D. Bender, Guilherme S. Cardoso, Arthur C. de Oliveira, Lucas C. Severo, Alessandro Girardi, Tiago R. Balen
Testing fully differential amplifiers using common mode feedback circuit: A case study. LASCAS (2015)
Cristiano P. Chenet, Lucas A. Tambara, Gabriel de M. Borges, Fernanda Lima Kastensmidt, Marcelo Soares Lubaszewski, Tiago R. Balen
Exploring design diversity redundancy to improve resilience in mixed-signal systems. Microelectron. Reliab. 55 (12) (2015)
Alisson J. C. Lanot, Tiago R. Balen
Reliability Analysis of a 130nm Charge Redistribution SAR ADC under Single Event Effects. SBCCI (2014)
Cristiano P. Chenet, Alisson J. C. Lanot, Tiago R. Balen
Design diversity redundancy with spatial-temporal voting applied to data acquisition systems. LATW (2014)
Alisson J. C. Lanot, Tiago R. Balen
Analysis of the effects of single event transients on an SAR-ADC based on charge redistribution. LATW (2014)
Lucas A. Tambara, Fernanda Lima Kastensmidt, Paolo Rech, Tiago R. Balen, Marcelo Lubaszewski
Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC. ISVLSI (2013)
Guilherme S. Cardoso, Tiago R. Balen, Marcelo Soares Lubaszewski, Rafael Galhardo Vaz, Odair Lelis Goncalez
Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers. LATW (2012)
Tiago R. Balen, Guilherme Schwanke Cardoso, Odair Lelis Gonçalez, Marcelo Soares Lubaszewski
Investigating the effects of transient faults in Programmable Capacitor Arrays. LATW (2011)
Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski
Diversity TMR: Proof of concept in a mixed-signal case. LATW (2010)
Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski
Evaluating the effectiveness of a mixed-signal TMR scheme based on design diversity. SBCCI (2010)
Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski
Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy. ETS (2010)
Tiago R. Balen, Marcelo Lubaszewski
Radiation effects on programmable analog devices and mitigation techniques. IOLTS (2010)
Franco Leite, Tiago R. Balen, Marcos Hervé, Marcelo Lubaszewski, Gilson I. Wirth
Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors. LATW (2009)
Tiago R. Balen, Fernanda Lima Kastensmidt, Marcelo Lubaszewski, Michel Renovell
Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation. ISVLSI (2007)
Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell
Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. J. Electron. Test. 23 (6) (2007)
Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell
Functional Test of Field Programmable Analog Arrays. VTS (2006)
Antonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell
Built-in self-test of global interconnects of field programmable analog arrays. Microelectron. J. 36 (12) (2005)
Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell
Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. VTS (2005)
Tiago R. Balen, Antonio Q. Andrade, Florence Azaïs, Marcelo Lubaszewski, Michel Renovell
Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. J. Electron. Test. 21 (2) (2005)
Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell
An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. VTS (2004)
Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski
Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. ITC (2004)