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Reliability Analysis of a 130nm Charge Redistribution SAR ADC under Single Event Effects.

Alisson J. C. LanotTiago R. Balen
Published in: SBCCI (2014)
Keyphrases
  • reliability analysis
  • event detection
  • parameter estimation
  • image reconstruction
  • sar images
  • case study
  • evolutionary algorithm
  • rough sets
  • simulated annealing